Sensor Based Modeling of Copper Chemical Mechanical Planarization
Upendra Phatak
Broschiertes Buch

Sensor Based Modeling of Copper Chemical Mechanical Planarization

Modeling the slurry chemistry effects on Material Removal Rate (MRR)

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The variations in slurry chemistry parameters including pH, concentrations of complexing and corrosion inhibiting agents, and slurry flow rates as well as average MRR in Cu-CMP process are modeled using features from two vibration sensors (one wired and the other wireless accelerometer). The study is perhaps one of the first efforts to use wireless vibration sensors for real-time monitoring of MRR and the chief slurry chemistry parameters in CMP. We hope that this work will lead to the advent of physics-based process-machine interaction (PMI) models that can be used to delineate the various pr...