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Finally, we strongly believe that this year s conference continued the tra- tions of having a high scienti?c and technical quality as well as an extensive dialogue on key issues of service availability. May 2008 Fumihiro Maruyama Andras Pataricza Organization ISAS 2008 was sponsored by the Research Center for Advanced Science and Technology (RCAST), University of Tokyo and Service Availability Forum, in cooperation with IEICE TC on Dependable Computing and GI TC on Depe- ability and Fault Tolerance. Organizing Committee General Chair Takashi Nanya (University of Tokyo, Japan) Program Co-chairs…mehr

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Finally, we strongly believe that this year s conference continued the tra- tions of having a high scienti?c and technical quality as well as an extensive dialogue on key issues of service availability. May 2008 Fumihiro Maruyama Andras Pataricza Organization ISAS 2008 was sponsored by the Research Center for Advanced Science and Technology (RCAST), University of Tokyo and Service Availability Forum, in cooperation with IEICE TC on Dependable Computing and GI TC on Depe- ability and Fault Tolerance. Organizing Committee General Chair Takashi Nanya (University of Tokyo, Japan) Program Co-chairs Andras Pataricza(BudapestUniversityofTechnologyandEconomics,Hungary) Fumihiro Maruyama (Fujitsu Lab. , Japan) Finance Chair H. Nakamura (University of Tokyo, Japan) Local Arrangement Chair M. Imai (University of Tokyo, Japan) Registration Chair M. Kondo (University of Tokyo, Japan) Publicity Chair M. Reitenspieß (Fujitsu Siemens Computers, Germany) Publication Chair M. Malek (Humboldt University, Germany) Web Master H. Okamura (Hiroshima University, Japan) Steering Committee M. Reitenspieß (Fujitsu Siemens Computers, Germany) S. Benlarbi (Alcatel, Canada) T. Dohi (Hiroshima University, Japan) M. Malek (Humboldt University, Germany) D. Penkler (HP, France) F. Tam (Nokia, Finland) X Organization ProgramCommittee A. Avritzer (Siemens, USA) D. Bakken (Washington S. , USA) R. Baldoni (University of Rome, Italy) G. Chockler (IBM, Israel) C. Fetzer (TU Dresden, Germany) F. Fraikin (SDM, Germany) R. Fricks (Motorola, USA) M. Funabashi (Hitachi, Japan) A. Gokhale (Vanderbilt, USA) K. Hidaka (IBM, Japan) M. Hiller (Volvo, Sweden) H. Ichikawa (UEC, Japan) K. Iwasaki (Tokyo Metropolitan University, Japan) Z. Kalbarczyk (UIUC, USA) T.