Simulation of bit patterned media applied to data storage devices - Arbeláez Echeverri, Oscar David;Restrepo Parra, Elisabeth
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Bit patterned media is a promising candidate for the next generation of high density magnetic recording media, given its nano structure and special magnetic isolation properties, then new challenges arise in terms of construction and recording. In the present book we showcase how these challenges compare to the ones hindering the development of classical multi grain magnetic recording media and explore a way to relax the manufacturing quality requirements of this novel approach to magnetic recording.

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Produktbeschreibung
Bit patterned media is a promising candidate for the next generation of high density magnetic recording media, given its nano structure and special magnetic isolation properties, then new challenges arise in terms of construction and recording. In the present book we showcase how these challenges compare to the ones hindering the development of classical multi grain magnetic recording media and explore a way to relax the manufacturing quality requirements of this novel approach to magnetic recording.
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Autorenporträt
Oscar David Arbeláez Echeverri, MSc. Physiscs, is a young researcher in computational physics, in his still short career he has made several contributions to the field of atomistic simulation of magnetic nano materials. Elisabeth Restrepo Parra, PhD., currently holds a full professor position in the Universidad Nacional de Colombia, she has made copious contributions to plasma physics and computational magnetism.