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Produktbild: Single Event Effects in Aerosp

Single Event Effects in Aerosp

187,99 €

inkl. gesetzl. MwSt., Versandkostenfrei

Beschreibung

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

04.10.2011

Abbildungen

Photos: 86 B&W, 0 Color; Drawings: 27 B&W, 0 Color; Graphs: 210 B&W, 0 Color

Verlag

John Wiley & Sons

Seitenzahl

520

Maße (L/B/H)

24/16,1/3,2 cm

Gewicht

938 g

Auflage

1. Auflage

Sprache

Englisch

ISBN

978-0-470-76749-8

Beschreibung

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

04.10.2011

Abbildungen

Photos: 86 B&W, 0 Color; Drawings: 27 B&W, 0 Color; Graphs: 210 B&W, 0 Color

Verlag

John Wiley & Sons

Seitenzahl

520

Maße (L/B/H)

24/16,1/3,2 cm

Gewicht

938 g

Auflage

1. Auflage

Sprache

Englisch

ISBN

978-0-470-76749-8

Herstelleradresse

Libri GmbH
Europaallee 1
36244 Bad Hersfeld
DE

Email: GPSR Kontakt

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  • Produktbild: Single Event Effects in Aerosp
  • 1. Introduction 1
     
    1.1 Background 1
     
    1.2 Analysis of Single Event Experiments 7
     
    1.3 Modeling Space and Avionics See Rates 8
     
    1.4 Overview of this Book 10
     
    1.5 Scope of this Book 11
     
    2. Foundations of Single Event Analysis and Prediction 13
     
    2.1 Overview of Single Particle Effects 13
     
    2.2 Particle Energy Deposition 15
     
    2.3 Single Event Environments 18
     
    2.4 Charge Collection and Upset 58
     
    2.5 Effective Let 60
     
    2.6 Charge Collection Volume and the Rectangular Parallelepiped (RPP) 61
     
    2.7 Upset Cross Section Curves 62
     
    2.8 Critical Charge 62
     
    2.9 Upset Sensitivity and Feature Size 67
     
    2.10 Cross-Section Concepts 67
     
    3. Optimizing Heavy Ion Experiments for Analysis 77
     
    3.1 Sample Heavy Ion Data 78
     
    3.2 Test Requirements 78
     
    3.3 Curve Parameters 80
     
    3.4 Angular Steps 85
     
    3.5 Stopping Data Accumulation When You Reach the Saturation Cross Section 86
     
    3.6 Device Shadowing Effects 88
     
    3.7 Choice of Ions 89
     
    3.8 Determining the LET in the Device 91
     
    3.9 Energy Loss Spread 94
     
    3.10 Data Requirements 95
     
    3.11 Experimental Statistics and Uncertainties 97
     
    3.12 Effect of Dual Thresholds 98
     
    3.13 Fitting Cross-Section Data 99
     
    3.14 Other Sources of Error and Uncertainties 101
     
    4. Optimizing Proton Testing 103
     
    4.1 Monitoring the Beam Intensity and Uniformity 103
     
    4.2 Total Dose Limitations on Testing 104
     
    4.3 Shape of the Cross-Section Curve 105
     
    5. Data Qualification and Interpretation 111
     
    5.1 Data Characteristics 111
     
    5.2 Approaches to Problem Data 121
     
    5.3 Interpretation of Heavy Ion Experiments 142
     
    5.4 Possible Problems with Least Square Fitting Using the Weibull Function 158
     
    6. Analysis of Various Types of SEU Data 165
     
    6.1 Critical Charge 165
     
    6.2 Depth and Critical Charge 166
     
    6.3 Charge Collection Mechanisms 168
     
    6.4 Charge Collection and the Cross-Section Curve 170
     
    6.5 Efficacy (Variation of SEU Sensitivity within a Cell) 174
     
    6.6 Mixed-Mode Simulations 185
     
    6.7 Parametric Studies of Device Sensitivity 198
     
    6.8 Influence of Ion Species and Energy 215
     
    6.9 Device Geometry and the Limiting Cross Section 218
     
    6.10 Track Size Effects 220
     
    6.11 Cross-Section Curves and the Charge Collection Processes 221
     
    6.12 Single Event Multiple-Bit Upset 226
     
    Environment 240
     
    6.13 SEU in Logic Systems 246
     
    6.14 Transient Pulses 249
     
    7. Cosmic Ray Single Event Rate Calculations 251
     
    7.1 Introduction to Rate Prediction Methods 252
     
    7.2 The RPP Approach to Heavy Ion Upset Rates 252
     
    7.3 The Integral RPP Approach 260
     
    7.4 Shape of the Cross-Section Curve 264
     
    7.5 Assumptions Behind the RPP and IRPP Methods 270
     
    7.6 Effective Flux Approach 285
     
    7.7 Upper Bound Approaches 287
     
    7.8 Figure of Merit Upset Rate Equations 288
     
    7.9 Generalized Figure of Merit 290
     
    7.10 The FOM and the LOG Normal Distribution 299
     
    7.11 Monte Carlo Approaches 300
     
    7.12 PRIVIT 302
     
    7.13 Integral Flux Method 302
     
    8. Proton Single Event Rate Calculations 305
     
    8.1 Nuclear Reaction Analysis 306
     
    8.2 Semiempirical Approaches and the Integral Cross-Section Calculation 313
     
    8.3 Relationship of Proton and Heavy Ion Upsets 316
     
    8.4 Correlation of the FOM with Proton Upset Cross Sections 317