Edward Petersen

Single Event Effects in Aerosp

• Gebundenes Buch

Produktbeschreibung

This book introduces the basic concepts necessary to understand Single Event phenomena which could cause random performance errors and catastrophic failures to electronics devices. As miniaturization of electronics components advances, electronics components are more susceptible in the radiation environment. The book includes a discussion of the radiation environments in space and in the atmosphere, radiation rate prediction depending on the orbit to allow electronics engineers to design and select radiation tolerant components and systems, and single event prediction.

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Enables readers to better understand, calculate, and manage single event effects
Single event effects, caused by single ionizing particles that penetrate sensitive nodes within an electronic device, can lead to anything from annoying system responses to catastrophic system failures. As electronic components continue to become smaller and smaller due to advances in miniaturization, electronic components designed for avionics are increasingly susceptible to these single event phenomena. With this book in hand, readers learn the core concepts needed to understand, predict, and manage disruptive and potentially damaging single event effects.
Setting the foundation, the book begins with a discussion of the radiation environments in space and in the atmosphere. Next, the book draws together and analyzes some thirty years of findings and best practices reported in the literature, exploring such critical topics as:
Design of heavy ion and proton experiments to optimize the data needed for single event predictions
Data qualification and analysis, including multiple bit upset and parametric studies of device sensitivity
Pros and cons of different approaches to heavy ion, proton, and neutron rate predictions
Results of experiments that have tested space predictions
Single Event Effects in Aerospace is recommended for engineers who design or fabricate parts, subsystems, or systems used in avionics, missile, or satellite applications. It not only provides them with a current understanding of single event effects, it also enables them to predict single event rates in aerospace environments in order to make needed design adjustments.

Produktdetails

• Verlag: Wiley & Sons
• 1. Auflage
• Seitenzahl: 520
• Erscheinungstermin: 4. Oktober 2011
• Englisch
• Abmessung: 240mm x 161mm x 32mm
• Gewicht: 843g
• ISBN-13: 9780470767498
• ISBN-10: 0470767499
• Artikelnr.: 31187302

Autorenporträt

EDWARD PETERSEN, PhD, worked for the Naval Research Laboratory from 1969 to 1993. Since then, he has served as a consultant. Dr. Petersen's research has focused on estimating upset rates for satellite systems. His work has shown that measurements of space upset rates are consistent with predictions based on laboratory experiments. He has authored or coauthored sixty papers on radiation effects, the majority dealing with single event effects. An IEEE Fellow, Dr. Petersen was the recipient of the IEEE Nuclear and Plasma Sciences Society Radiation Effects Award.

Inhaltsangabe

1. Introduction 1 1.1 Background 1 1.2 Analysis of Single Event Experiments
7 1.3 Modeling Space and Avionics See Rates 8 1.4 Overview of this Book 10
1.5 Scope of this Book 11 2. Foundations of Single Event Analysis and
Prediction 13 2.1 Overview of Single Particle Effects 13 2.2 Particle
Energy Deposition 15 2.3 Single Event Environments 18 2.4 Charge Collection
and Upset 58 2.5 Effective Let 60 2.6 Charge Collection Volume and the
Rectangular Parallelepiped (RPP) 61 2.7 Upset Cross Section Curves 62 2.8
Critical Charge 62 2.9 Upset Sensitivity and Feature Size 67 2.10
Cross-Section Concepts 67 3. Optimizing Heavy Ion Experiments for Analysis
77 3.1 Sample Heavy Ion Data 78 3.2 Test Requirements 78 3.3 Curve
Parameters 80 3.4 Angular Steps 85 3.5 Stopping Data Accumulation When You
Reach the Saturation Cross Section 86 3.6 Device Shadowing Effects 88 3.7
Choice of Ions 89 3.8 Determining the LET in the Device 91 3.9 Energy Loss
Spread 94 3.10 Data Requirements 95 3.11 Experimental Statistics and
Uncertainties 97 3.12 Effect of Dual Thresholds 98 3.13 Fitting
Cross-Section Data 99 3.14 Other Sources of Error and Uncertainties 101 4.
Optimizing Proton Testing 103 4.1 Monitoring the Beam Intensity and
Uniformity 103 4.2 Total Dose Limitations on Testing 104 4.3 Shape of the
Cross-Section Curve 105 5. Data Qualification and Interpretation 111 5.1
Data Characteristics 111 5.2 Approaches to Problem Data 121 5.3
Interpretation of Heavy Ion Experiments 142 5.4 Possible Problems with
Least Square Fitting Using the Weibull Function 158 6. Analysis of Various
Types of SEU Data 165 6.1 Critical Charge 165 6.2 Depth and Critical Charge
166 6.3 Charge Collection Mechanisms 168 6.4 Charge Collection and the
Cross-Section Curve 170 6.5 Efficacy (Variation of SEU Sensitivity within a
Cell) 174 6.6 Mixed-Mode Simulations 185 6.7 Parametric Studies of Device
Sensitivity 198 6.8 Influence of Ion Species and Energy 215 6.9 Device
Geometry and the Limiting Cross Section 218 6.10 Track Size Effects 220
6.11 Cross-Section Curves and the Charge Collection Processes 221 6.12
Single Event Multiple-Bit Upset 226 Environment 240 6.13 SEU in Logic
Systems 246 6.14 Transient Pulses 249 7. Cosmic Ray Single Event Rate
Calculations 251 7.1 Introduction to Rate Prediction Methods 252 7.2 The
RPP Approach to Heavy Ion Upset Rates 252 7.3 The Integral RPP Approach 260
7.4 Shape of the Cross-Section Curve 264 7.5 Assumptions Behind the RPP and
IRPP Methods 270 7.6 Effective Flux Approach 285 7.7 Upper Bound Approaches
287 7.8 Figure of Merit Upset Rate Equations 288 7.9 Generalized Figure of
Merit 290 7.10 The FOM and the LOG Normal Distribution 299 7.11 Monte Carlo
Approaches 300 7.12 PRIVIT 302 7.13 Integral Flux Method 302 8. Proton
Single Event Rate Calculations 305 8.1 Nuclear Reaction Analysis 306 8.2
Semiempirical Approaches and the Integral Cross-Section Calculation 313 8.3
Relationship of Proton and Heavy Ion Upsets 316 8.4 Correlation of the FOM
with Proton Upset Cross Sections 317 8.5 Upsets Due to Rare High Energy
Proton Reactions 318 8.6 Upset Due to Ionization by Stopping Protons Helium
Ions and Iron Ions 320 9. Neutron Induced Upset 329 9.1 Neutron Upsets in
Avionics 330 9.2 Upsets at Ground Level 335 10. Upsets Produced by Heavy
Ion Nuclear Reactions 337 10.1 Heavy Ion Nuclear Reactions 337 10.2 Upset
Rate Calculations for Combined Ionization and Reactions 340 10.3 Heavy
Nuclear Ion Reactions Summary 342 11. Samples of Heavy Ion Rate Prediction
345 11.1 Low Threshold Studies 345 11.2 Comparison of Upset Rates for
Weibull and Lognormal Functions 347 11.3 Low Threshold-Medium Lc data 352
11.4 See Sensitivity and LET Thresholds 353 11.5 Choosing Area and Depth
for Rate Calculations 360 11.6 Running CREME96 Type Codes 361 11.7 CREME-MC
and SPENVIS 367 11.8 Effect of Uncertainties in Cross Section on Upset
Rates 368 12. Samples of Proton Rate Predictions 371 12.1 Trapped Protons
371 12.2 Correlation of the FOM with Proton Upset Rates 371 13. Combined
Environments 375 13.1 Relative Proton and Cosmic Ray Upset Rates 375 13.2
Calculation of Combined Rates Using the Figure of Merit 375 13.3 Rate
Coefficients for a Particular New Orbit 380 13.4 Rate Coefficients for Any
Circular Orbit About the Earth 381 13.5 Ratio of Proton to Heavy Ion Upsets
for Near Earth Circular Orbits 381 13.6 Single Events from Ground to Outer
Space 383 14. Samples of Solar Events and Extreme Situations 389 15. Upset
Rates in Neutral Particle Beam (NPB) Environments 395 15.1 Characteristics
of NPB Weapons 395 15.2 Upsets in the NPB Beam 397 16. Predictions and
Observations of SEU Rates in Space 401 16.1 Results of Space Observations
402 16.2 Environmental Uncertainties 413 16.3 Examination of Outliers 417
16.4 Possible Reasons for Poor Upset Rate Predictions 418 16.5 Constituents
of a Good Rate Comparison Paper 420 16.6 Summary and Conclusions 425 16.7
Recent Comparisons 427 16.8 Comparisons with Events During Solar Activity
427 17. Limitations of the IRPP Approach 429 17.1 The IRPP and Deep Devices
429 17.2 The RPP When Two Hits are Required 430 17.3 The RPP Approaches
Neglect Track Size 430 17.4 The IRPP Calculates Number of Events not Total
Number of Upsets 431 17.5 The RPP Approaches Neglect Effects that Arise
Outside the Sensitive Volume 431 17.6 The IRPP Approaches Assume that the
Effect of Different Particles with the Same LET is Equivalent 431 17.7 The
IRPP Approaches Assume that the LET of the Particle is not Changing in the
Sensitive Volume 432 17.8 The IRPP Approach Assumes that the Charge
Collection Does Not Change with Device Orientation 433 17.9 The Status of
Single Event Rate Analysis 433 Appendix A Useful Numbers 435 Appendix B
Reference Equations 437 Appendix C Quick Estimates of Upset Rates Using the
Figure of Merit 445 Appendix D Part Characteristics 448 Appendix E Sources
of Device Data 452 References 455 Author Index 489 Subject Index 495