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  • Produktbild: Soft Errors
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Soft Errors From Particles to Circuits

Aus der Reihe Devices, Circuits, and Systems

106,99 €

inkl. gesetzl. MwSt., Versandkostenfrei

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

30.09.2020

Verlag

Taylor & Francis

Seitenzahl

440

Maße (L/B/H)

25,4/17,8/2,4 cm

Gewicht

822 g

Sprache

Englisch

ISBN

978-0-367-65599-0

Beschreibung

Rezension

"Soft Errors: From Particles to Circuits covers all aspects of the design, use, application, performance, and testing of parts, devices, and systems and addresses every perspective from an engineering, scientific, or physical point of view. ... Many good texts have been written on similar subjects, but none as thorough, as clear, and as complete as this volume. ... [The authors] have mastered the past, absorbed the present, and captured the trends of the future in one of the most important technologies of our time. ... An extremely useful text that has succeeded in presenting with clarity a complex reality in accessible, understandable, and helpful terms."
-Epaminondas G. Stassinopoulos, Emeritus, NASA/GSFC, USA

"The few radiation effects books out there are focused on space environments or simply on MOSFET degradation. This book...is focused on the terrestrial environment and goes from basic physics and devices to final product applications, and thus should appeal to a much broader audience than other texts. ... This book goes a long way in educating future and existing engineers on how to determine the causes and magnitude of the problems in such systems. ... [This book's strengths are its] focus on the terrestrial environment and the breadth of coverage from particle to device including characterization and modeling techniques."
-Robert Baumann, Texas Instruments, Dallas, USA

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

30.09.2020

Verlag

Taylor & Francis

Seitenzahl

440

Maße (L/B/H)

25,4/17,8/2,4 cm

Gewicht

822 g

Sprache

Englisch

ISBN

978-0-367-65599-0

EU-Ansprechpartner

Taylor & Francis Verlag GmbH
Kaufingerstraße 24
80331 München
DE
GPSR@taylorandfrancis.com

Herstelleradresse

Taylor & Francis Group
5 Howick Place
SW1P 1WG London
UK
GPSR@taylorandfrancis.com

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  • Produktbild: Soft Errors
  • Produktbild: Soft Errors

  • Terrestrial Cosmic Rays and Atmospheric Radiation Background. Detection and Characterization of Atmospheric Neutrons at Terrestrial Level: Neutron Monitors. Natural Radioactivity of Electronic Materials. Alpha-Radiation Metrology in Electronic Materials. Particle Interactions with Matter and Mechanisms of Soft Errors in Semiconductor Circuits. Accelerated Tests. Real-Time (Life) Testing. Modeling and Simulation of Single-Event Effects in Devices and Circuits. Soft-Error Rate (SER) Monte Carlo Simulation Codes. Scaling Effects and Their Implications for Soft Errors. Natural Radiation in Nonvolatile Memories: A Case Study. SOI, FinFET, and Emerging Devices.