This book presents a range of applications for low-energy electron diffraction (LEED), Auger electron spectroscopy (AES), and X-ray photoelectron spectroscopy (XPS). It applies both scanning tunneling and atomic force microscopy to in situ studies of structures of substrates and adsorbates during electrochemical measurements. It then presents a theoretical approach to modelling the electrochemical interface.
Bitte wählen Sie Ihr Anliegen aus.
Rechnungen
Retourenschein anfordern
Bestellstatus
Storno