Surface Analysis
The Principal Techniques
Ed. by John C. Vickerman and Ian Gilmore
Surface Analysis
The Principal Techniques
Ed. by John C. Vickerman and Ian Gilmore
- Broschiertes Buch
- Merkliste
- Auf die Merkliste
- Bewerten Bewerten
- Teilen
- Produkt teilen
- Produkterinnerung
- Produkterinnerung
This completely updated and revised second edition of Surface Analysis: The Principal Techniques, deals with the characterisation and understanding of the outer layers of substrates, how they react, look and function which are all of interest to surface scientists.
Die Theorie und Praxis der Oberflächenanalyse wird von Experten mehrerer Fachgebiete erläutert. Dadurch wird der Leser in die Lage versetzt, Ergebnisse und Datenreihen zu verstehen und umzusetzen.
Andere Kunden interessierten sich auch für
- Lech PawlowskiThe Science and Engineering of Thermal Spray Coatings363,99 €
- Milan PaunovicFundamentals of Electrochemical Deposition184,99 €
- Rory A. WolfAtmospheric Pressure Plasma for Surface Modification224,99 €
- W. Roy MasonMagnetic Circular Dichroism Spectroscopy219,99 €
- R. A. Pethrick / C. Viney (Hgg.)Techniques for Polymer Organisation and Morphology Characterisation365,99 €
- D. E. PackhamHandbook of Adhesion501,99 €
- Henry WarsonApplications of Synthetic Resin Latices, Fundamental Chemistry of Latices and Applications in Adhesives593,99 €
-
-
-
This completely updated and revised second edition of Surface Analysis: The Principal Techniques, deals with the characterisation and understanding of the outer layers of substrates, how they react, look and function which are all of interest to surface scientists.
Die Theorie und Praxis der Oberflächenanalyse wird von Experten mehrerer Fachgebiete erläutert. Dadurch wird der Leser in die Lage versetzt, Ergebnisse und Datenreihen zu verstehen und umzusetzen.
Die Theorie und Praxis der Oberflächenanalyse wird von Experten mehrerer Fachgebiete erläutert. Dadurch wird der Leser in die Lage versetzt, Ergebnisse und Datenreihen zu verstehen und umzusetzen.
Produktdetails
- Produktdetails
- Verlag: Wiley & Sons
- 2. Aufl.
- Seitenzahl: 688
- Erscheinungstermin: 1. Mai 2009
- Englisch
- Abmessung: 244mm x 170mm x 37mm
- Gewicht: 1450g
- ISBN-13: 9780470017647
- ISBN-10: 0470017643
- Artikelnr.: 23800526
- Verlag: Wiley & Sons
- 2. Aufl.
- Seitenzahl: 688
- Erscheinungstermin: 1. Mai 2009
- Englisch
- Abmessung: 244mm x 170mm x 37mm
- Gewicht: 1450g
- ISBN-13: 9780470017647
- ISBN-10: 0470017643
- Artikelnr.: 23800526
John C. Vickerman BSc in Chemistry (Edinburgh), Ph.D. in Surface Chemistry (Bristol), DSc (Bristol). Predoctoral fellowships at the Universities of Perugia and Rome, postdoctoral fellowships at the University of Bristol and the Technical University of Eindhoven. Sabbatical study periods at the University of Munich, the Free University of Berlin and Pennsylvania State University. Dr Ian Gilmore, Surface and Nano-Analysis, National Physical Laboratory, Teddington, UK Ian is a Principal Research Scientist in the Surface and Nano-Analysis Research team and joined NPL in 1991. His research has a focus on the analysis of complex molecules at surfaces. Recent research has led to the development of a novel new variant of static static SIMS called gentle-SIMS or G-SIMS, He received a degree in Physics from the University of Manchester in 1991 and a PhD from the University of Loughborough in 2000. Ian is a Fellow of the Institute of Physics a member of the EPSRC College and a member of the American Vacuum Society.
List of Contributors. Preface. 1 Introduction (John C. Vickerman). 1.1 How
do we Define the Surface? 1.2 How Many Atoms in a Surface? 1.3 Information
Required. 1.4 Surface Sensitivity. 1.5 Radiation Effects - Surface Damage.
1.6 Complexity of the Data. 2 Auger Electron Spectroscopy (Hans Jörg
Mathieu). 2.1 Introduction. 2.2 Principle of the Auger Process. 2.3
Instrumentation. 2.4 Quantitative Analysis. 2.5 Depth Profile Analysis. 2.6
Summary. References. Problems. 3 Electron Spectroscopy for Chemical
Analysis (Buddy D. Ratner and David G. Castner). 3.1 Overview. 3.2 X-ray
Interaction with Matter, the Photoelectron Effect and Photoemission from
Solids. 3.3 Binding Energy and the Chemical Shift. 3.4 Inelastic Mean Free
Path and Sampling Depth. 3.5 Quantification. 3.6 Spectral Features. 3.7
Instrumentation. 3.8 Spectral Quality. 3.9 Depth Profiling. 3.10 X-Y
Mapping and Imaging. 3.11 Chemical Derivatization. 3.12 Valence Band. 3.13
Perspectives. 3.14 Conclusions. Acknowledgements. References. Problems. 4
Molecular Surface Mass Spectrometry by SIMS (John C. Vickerman). 4.1
Introduction. 4.2 Basic Concepts. 4.3 Experimental Requirements. 4.4
Secondary Ion Formation. 4.5 Modes of Analysis. 4.6 Ionization of the
Sputtered Neutrals. 4.7 Ambient Methods of Desorption Mass Spectrometry.
References. Problems. 5 Dynamic SIMS (David McPhail and Mark Dowsett). 5.1
Fundamentals and Attributes. 5.2 Areas and Methods of Application. 5.3
Quantification of Data. 5.4 Novel Approaches. 5.5 Instrumentation. 5.6
Conclusions. References. Problems. 6 Low-Energy Ion Scattering and
Rutherford Backscattering (Edmund Taglauer). 6.1 Introduction. 6.2 Physical
Basis. 6.3 Rutherford Backscattering. 6.4 Low-Energy Ion Scattering.
Acknowledgement. References. Problems. Key Facts. 7 Vibrational
Spectroscopy from Surfaces (Martyn E. Pemble and Peter Gardner). 7.1
Introduction. 7.2 Infrared Spectroscopy from Surfaces. 7.3 Electron Energy
Loss Spectroscopy (EELS). 7.4 The Group Theory of Surface Vibrations. 7.5
Laser Raman Spectroscopy from Surfaces. 7.6 Inelastic Neutron Scattering
(INS). 7.7 Sum-Frequency Generation Methods. References. Problems. 8
Surface Structure Determination by Interference Techniques (Christopher A.
Lucas). 8.1 Introduction. 8.2 Electron Diffraction Techniques. 8.3 X-ray
Techniques. 8.4 Photoelectron Diffraction. References. 9 Scanning Probe
Microscopy (Graham J. Leggett). 9.1 Introduction. 9.2 Scanning Tunnelling
Microscopy. 9.3 Atomic Force Microscopy. 9.4 Scanning Near-Field Optical
Microscopy. 9.5 Other Scanning Probe Microscopy Techniques. 9.6 Lithography
Using Probe Microscopy Methods. 9.7 Conclusions. References. Problems. 10
The Application of Multivariate Data Analysis Techniques in Surface
Analysis (Joanna L.S. Lee and Ian S. Gilmore). 10.1 Introduction. 10.2
Basic Concepts. 10.3 Factor Analysis for Identification. 10.4 Regression
Methods for Quantification. 10.5 Methods for Classification. 10.6 Summary
and Conclusion. Acknowledgements. References. Problems. Appendix 1 Vacuum
Technology for Applied Surface Science (Rod Wilson). A1.1 Introduction:
Gases and Vapours. A1.2 The Pressure Regions of Vacuum Technology and their
Characteristics. A1.3 Production of a Vacuum. A1.4 Measurement of Low
Pressures. Acknowledgement. References. Appendix 2 Units, Fundamental
Physical Constants and Conversions. A2.1 Base Units of the SI. A2.2
Fundamental Physical Constants. A2.3 Other Units and Conversions to SI.
References. Index.
do we Define the Surface? 1.2 How Many Atoms in a Surface? 1.3 Information
Required. 1.4 Surface Sensitivity. 1.5 Radiation Effects - Surface Damage.
1.6 Complexity of the Data. 2 Auger Electron Spectroscopy (Hans Jörg
Mathieu). 2.1 Introduction. 2.2 Principle of the Auger Process. 2.3
Instrumentation. 2.4 Quantitative Analysis. 2.5 Depth Profile Analysis. 2.6
Summary. References. Problems. 3 Electron Spectroscopy for Chemical
Analysis (Buddy D. Ratner and David G. Castner). 3.1 Overview. 3.2 X-ray
Interaction with Matter, the Photoelectron Effect and Photoemission from
Solids. 3.3 Binding Energy and the Chemical Shift. 3.4 Inelastic Mean Free
Path and Sampling Depth. 3.5 Quantification. 3.6 Spectral Features. 3.7
Instrumentation. 3.8 Spectral Quality. 3.9 Depth Profiling. 3.10 X-Y
Mapping and Imaging. 3.11 Chemical Derivatization. 3.12 Valence Band. 3.13
Perspectives. 3.14 Conclusions. Acknowledgements. References. Problems. 4
Molecular Surface Mass Spectrometry by SIMS (John C. Vickerman). 4.1
Introduction. 4.2 Basic Concepts. 4.3 Experimental Requirements. 4.4
Secondary Ion Formation. 4.5 Modes of Analysis. 4.6 Ionization of the
Sputtered Neutrals. 4.7 Ambient Methods of Desorption Mass Spectrometry.
References. Problems. 5 Dynamic SIMS (David McPhail and Mark Dowsett). 5.1
Fundamentals and Attributes. 5.2 Areas and Methods of Application. 5.3
Quantification of Data. 5.4 Novel Approaches. 5.5 Instrumentation. 5.6
Conclusions. References. Problems. 6 Low-Energy Ion Scattering and
Rutherford Backscattering (Edmund Taglauer). 6.1 Introduction. 6.2 Physical
Basis. 6.3 Rutherford Backscattering. 6.4 Low-Energy Ion Scattering.
Acknowledgement. References. Problems. Key Facts. 7 Vibrational
Spectroscopy from Surfaces (Martyn E. Pemble and Peter Gardner). 7.1
Introduction. 7.2 Infrared Spectroscopy from Surfaces. 7.3 Electron Energy
Loss Spectroscopy (EELS). 7.4 The Group Theory of Surface Vibrations. 7.5
Laser Raman Spectroscopy from Surfaces. 7.6 Inelastic Neutron Scattering
(INS). 7.7 Sum-Frequency Generation Methods. References. Problems. 8
Surface Structure Determination by Interference Techniques (Christopher A.
Lucas). 8.1 Introduction. 8.2 Electron Diffraction Techniques. 8.3 X-ray
Techniques. 8.4 Photoelectron Diffraction. References. 9 Scanning Probe
Microscopy (Graham J. Leggett). 9.1 Introduction. 9.2 Scanning Tunnelling
Microscopy. 9.3 Atomic Force Microscopy. 9.4 Scanning Near-Field Optical
Microscopy. 9.5 Other Scanning Probe Microscopy Techniques. 9.6 Lithography
Using Probe Microscopy Methods. 9.7 Conclusions. References. Problems. 10
The Application of Multivariate Data Analysis Techniques in Surface
Analysis (Joanna L.S. Lee and Ian S. Gilmore). 10.1 Introduction. 10.2
Basic Concepts. 10.3 Factor Analysis for Identification. 10.4 Regression
Methods for Quantification. 10.5 Methods for Classification. 10.6 Summary
and Conclusion. Acknowledgements. References. Problems. Appendix 1 Vacuum
Technology for Applied Surface Science (Rod Wilson). A1.1 Introduction:
Gases and Vapours. A1.2 The Pressure Regions of Vacuum Technology and their
Characteristics. A1.3 Production of a Vacuum. A1.4 Measurement of Low
Pressures. Acknowledgement. References. Appendix 2 Units, Fundamental
Physical Constants and Conversions. A2.1 Base Units of the SI. A2.2
Fundamental Physical Constants. A2.3 Other Units and Conversions to SI.
References. Index.
List of Contributors. Preface. 1 Introduction (John C. Vickerman). 1.1 How
do we Define the Surface? 1.2 How Many Atoms in a Surface? 1.3 Information
Required. 1.4 Surface Sensitivity. 1.5 Radiation Effects - Surface Damage.
1.6 Complexity of the Data. 2 Auger Electron Spectroscopy (Hans Jörg
Mathieu). 2.1 Introduction. 2.2 Principle of the Auger Process. 2.3
Instrumentation. 2.4 Quantitative Analysis. 2.5 Depth Profile Analysis. 2.6
Summary. References. Problems. 3 Electron Spectroscopy for Chemical
Analysis (Buddy D. Ratner and David G. Castner). 3.1 Overview. 3.2 X-ray
Interaction with Matter, the Photoelectron Effect and Photoemission from
Solids. 3.3 Binding Energy and the Chemical Shift. 3.4 Inelastic Mean Free
Path and Sampling Depth. 3.5 Quantification. 3.6 Spectral Features. 3.7
Instrumentation. 3.8 Spectral Quality. 3.9 Depth Profiling. 3.10 X-Y
Mapping and Imaging. 3.11 Chemical Derivatization. 3.12 Valence Band. 3.13
Perspectives. 3.14 Conclusions. Acknowledgements. References. Problems. 4
Molecular Surface Mass Spectrometry by SIMS (John C. Vickerman). 4.1
Introduction. 4.2 Basic Concepts. 4.3 Experimental Requirements. 4.4
Secondary Ion Formation. 4.5 Modes of Analysis. 4.6 Ionization of the
Sputtered Neutrals. 4.7 Ambient Methods of Desorption Mass Spectrometry.
References. Problems. 5 Dynamic SIMS (David McPhail and Mark Dowsett). 5.1
Fundamentals and Attributes. 5.2 Areas and Methods of Application. 5.3
Quantification of Data. 5.4 Novel Approaches. 5.5 Instrumentation. 5.6
Conclusions. References. Problems. 6 Low-Energy Ion Scattering and
Rutherford Backscattering (Edmund Taglauer). 6.1 Introduction. 6.2 Physical
Basis. 6.3 Rutherford Backscattering. 6.4 Low-Energy Ion Scattering.
Acknowledgement. References. Problems. Key Facts. 7 Vibrational
Spectroscopy from Surfaces (Martyn E. Pemble and Peter Gardner). 7.1
Introduction. 7.2 Infrared Spectroscopy from Surfaces. 7.3 Electron Energy
Loss Spectroscopy (EELS). 7.4 The Group Theory of Surface Vibrations. 7.5
Laser Raman Spectroscopy from Surfaces. 7.6 Inelastic Neutron Scattering
(INS). 7.7 Sum-Frequency Generation Methods. References. Problems. 8
Surface Structure Determination by Interference Techniques (Christopher A.
Lucas). 8.1 Introduction. 8.2 Electron Diffraction Techniques. 8.3 X-ray
Techniques. 8.4 Photoelectron Diffraction. References. 9 Scanning Probe
Microscopy (Graham J. Leggett). 9.1 Introduction. 9.2 Scanning Tunnelling
Microscopy. 9.3 Atomic Force Microscopy. 9.4 Scanning Near-Field Optical
Microscopy. 9.5 Other Scanning Probe Microscopy Techniques. 9.6 Lithography
Using Probe Microscopy Methods. 9.7 Conclusions. References. Problems. 10
The Application of Multivariate Data Analysis Techniques in Surface
Analysis (Joanna L.S. Lee and Ian S. Gilmore). 10.1 Introduction. 10.2
Basic Concepts. 10.3 Factor Analysis for Identification. 10.4 Regression
Methods for Quantification. 10.5 Methods for Classification. 10.6 Summary
and Conclusion. Acknowledgements. References. Problems. Appendix 1 Vacuum
Technology for Applied Surface Science (Rod Wilson). A1.1 Introduction:
Gases and Vapours. A1.2 The Pressure Regions of Vacuum Technology and their
Characteristics. A1.3 Production of a Vacuum. A1.4 Measurement of Low
Pressures. Acknowledgement. References. Appendix 2 Units, Fundamental
Physical Constants and Conversions. A2.1 Base Units of the SI. A2.2
Fundamental Physical Constants. A2.3 Other Units and Conversions to SI.
References. Index.
do we Define the Surface? 1.2 How Many Atoms in a Surface? 1.3 Information
Required. 1.4 Surface Sensitivity. 1.5 Radiation Effects - Surface Damage.
1.6 Complexity of the Data. 2 Auger Electron Spectroscopy (Hans Jörg
Mathieu). 2.1 Introduction. 2.2 Principle of the Auger Process. 2.3
Instrumentation. 2.4 Quantitative Analysis. 2.5 Depth Profile Analysis. 2.6
Summary. References. Problems. 3 Electron Spectroscopy for Chemical
Analysis (Buddy D. Ratner and David G. Castner). 3.1 Overview. 3.2 X-ray
Interaction with Matter, the Photoelectron Effect and Photoemission from
Solids. 3.3 Binding Energy and the Chemical Shift. 3.4 Inelastic Mean Free
Path and Sampling Depth. 3.5 Quantification. 3.6 Spectral Features. 3.7
Instrumentation. 3.8 Spectral Quality. 3.9 Depth Profiling. 3.10 X-Y
Mapping and Imaging. 3.11 Chemical Derivatization. 3.12 Valence Band. 3.13
Perspectives. 3.14 Conclusions. Acknowledgements. References. Problems. 4
Molecular Surface Mass Spectrometry by SIMS (John C. Vickerman). 4.1
Introduction. 4.2 Basic Concepts. 4.3 Experimental Requirements. 4.4
Secondary Ion Formation. 4.5 Modes of Analysis. 4.6 Ionization of the
Sputtered Neutrals. 4.7 Ambient Methods of Desorption Mass Spectrometry.
References. Problems. 5 Dynamic SIMS (David McPhail and Mark Dowsett). 5.1
Fundamentals and Attributes. 5.2 Areas and Methods of Application. 5.3
Quantification of Data. 5.4 Novel Approaches. 5.5 Instrumentation. 5.6
Conclusions. References. Problems. 6 Low-Energy Ion Scattering and
Rutherford Backscattering (Edmund Taglauer). 6.1 Introduction. 6.2 Physical
Basis. 6.3 Rutherford Backscattering. 6.4 Low-Energy Ion Scattering.
Acknowledgement. References. Problems. Key Facts. 7 Vibrational
Spectroscopy from Surfaces (Martyn E. Pemble and Peter Gardner). 7.1
Introduction. 7.2 Infrared Spectroscopy from Surfaces. 7.3 Electron Energy
Loss Spectroscopy (EELS). 7.4 The Group Theory of Surface Vibrations. 7.5
Laser Raman Spectroscopy from Surfaces. 7.6 Inelastic Neutron Scattering
(INS). 7.7 Sum-Frequency Generation Methods. References. Problems. 8
Surface Structure Determination by Interference Techniques (Christopher A.
Lucas). 8.1 Introduction. 8.2 Electron Diffraction Techniques. 8.3 X-ray
Techniques. 8.4 Photoelectron Diffraction. References. 9 Scanning Probe
Microscopy (Graham J. Leggett). 9.1 Introduction. 9.2 Scanning Tunnelling
Microscopy. 9.3 Atomic Force Microscopy. 9.4 Scanning Near-Field Optical
Microscopy. 9.5 Other Scanning Probe Microscopy Techniques. 9.6 Lithography
Using Probe Microscopy Methods. 9.7 Conclusions. References. Problems. 10
The Application of Multivariate Data Analysis Techniques in Surface
Analysis (Joanna L.S. Lee and Ian S. Gilmore). 10.1 Introduction. 10.2
Basic Concepts. 10.3 Factor Analysis for Identification. 10.4 Regression
Methods for Quantification. 10.5 Methods for Classification. 10.6 Summary
and Conclusion. Acknowledgements. References. Problems. Appendix 1 Vacuum
Technology for Applied Surface Science (Rod Wilson). A1.1 Introduction:
Gases and Vapours. A1.2 The Pressure Regions of Vacuum Technology and their
Characteristics. A1.3 Production of a Vacuum. A1.4 Measurement of Low
Pressures. Acknowledgement. References. Appendix 2 Units, Fundamental
Physical Constants and Conversions. A2.1 Base Units of the SI. A2.2
Fundamental Physical Constants. A2.3 Other Units and Conversions to SI.
References. Index.