Comprehensive textbook covering characterization techniques to understand the chemistry and structure of materials on surfaces and at interfaces Surface and Interface Analysis is a comprehensive textbook resource that covers everything readers need to know about surface energy, molecular speciation, and optical and physical characterization techniques. Assuming only basic knowledge of general chemistry (electronic orbitals, organic functional groups), physics (electromagnetic waves, Maxwell equations), physical chemistry (Schrödinger equation, harmonic oscillator), and mathematics (wave…mehr
Comprehensive textbook covering characterization techniques to understand the chemistry and structure of materials on surfaces and at interfaces Surface and Interface Analysis is a comprehensive textbook resource that covers everything readers need to know about surface energy, molecular speciation, and optical and physical characterization techniques. Assuming only basic knowledge of general chemistry (electronic orbitals, organic functional groups), physics (electromagnetic waves, Maxwell equations), physical chemistry (Schrödinger equation, harmonic oscillator), and mathematics (wave equations, covariance matrix), this textbook helps readers understand the underlying principles of the discussed characterization techniques and enables them to transform theoretical knowledge into applied skills through a Maieutic pedagogical approach. Written by a highly qualified professor, Surface and Interface Analysis: Principles and Applications includes information on: * Relationship between atomic and molecular orbitals and compositional analysis principles based on measurements of photoelectrons, Auger electrons, X-rays, and secondary ions emitted from the surface * Governance of electromagnetic wave propagation in a dielectric medium and what can be learned from analyzing the electromagnetic wave reflected from the interface * Surface metrology using light reflection (non-contact) and scanning probe (contact) and analysis of mechanical properties through indentation * Artifacts and misinterpretations that may be encountered during analysis Surface and Interface Analysis is an ideal textbook resource on the subject for graduate students in the fields of solid state physics, optics, materials science, chemistry, and engineering who want to learn and apply advanced materials characterization methods, along with undergraduate students in advanced elective courses.Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.
Seong H. Kim, PhD, is Distinguished Professor at the Department of Chemical Engineering of The Pennsylvania State University, USA. He is also affiliated with the Department of Materials Science and Engineering and the Department of Chemistry. He received his BS and MS degrees from Yonsei University, South Korea, and his PhD from Northwestern University, USA. He then worked as a postdoctoral researcher at the University of California, Berkeley, USA, before joining the faculty of chemical engineering at Penn State.
Inhaltsangabe
Preface xi About the Companion Website xv 1 Introduction 1 1.1 Types of Surface Analysis 1 1.2 Why Is Surface Analysis Done in Vacuum? 1 1.3 Surface Energy 6 1.4 Relationship Between Surface Energy and Physical Properties 8 1.5 Measuring Surface Energy 10 1.6 Bulk Properties Affected by Surface Energy 14 1.7 Further Reading for Surface Contamination and Vacuum 16 Practice Problems 16 References 17 2 Elemental Analysis via X-ray Irradiation 19 2.1 Electron Emission upon X-ray Absorption 19 2.2 Instrumentation for X-ray Photoelectron Spectroscopy (XPS) 27 2.3 Qualitative Analysis with XPS 37 2.4 Quantitative Analysis with XPS 48 2.5 Depth Profiling with XPS 68 2.6 Chemical Analysis with X-ray Absorption Spectroscopy (XAS) 73 2.7 Further Reading for XPS 78 Practice Problems 79 References 84 3 Elemental Analysis via Electron Irradiation 89 3.1 Principle of Auger Electron Spectroscopy (AES) 89 3.2 Qualitative Analysis with AES 93 3.3 Quantitative Analysis with AES 96 3.4 Scanning Auger Mapping 97 3.5 Further Reading for AES 99 Practice Problems 100 References 100 4 Elemental Analysis via Ion Irradiation 103 4.1 Principle of Secondary Ion Mass Spectrometry (SIMS) 103 4.2 Qualitative Analysis with SIMS 106 4.3 Quantitative Analysis with SIMS 111 4.4 Further Reading for SIMS 112 Practice Problems 112 References 113 5 Light Propagation, Absorption, and Reflection 115 5.1 Propagation and Absorption of Electromagnetic Wave 116 5.2 Reflection/Refraction at Interface of Two Media 128 5.3 Further Reading for IR and Raman Spectroscopy 139 Practice Problems 139 References 139 6 Spectroscopic Analysis via IR Reflection and Transmission 141 6.1 Attenuated Total Reflectance Infrared (ATR-IR) Spectroscopy 143 6.2 Specular Reflection Infrared (SR-IR) Spectroscopy 151 6.3 Reflection Absorption Infrared Spectroscopy (RAIRS) 158 6.4 Brewster-Angle Transmission (BAT) Infrared Spectroscopy 176 6.5 Diffuse-Reflectance Infrared Fourier Transform (DRIFT) Spectroscopy 180 6.6 IR Spectroscopic Imaging 183 6.7 Further Reading for Surface-Sensitive IR Spectroscopy 192 Practice Problems 192 References 193 7 Buried Interface Analysis via Nonlinear Spectroscopy 197 7.1 Nonlinear vs. Linear Optical Responses 197 7.2 Sum Frequency Generation (SFG) Process 200 7.3 SFG Spectroscopy Probing 2D Interface 211 7.4 SFG Spectroscopy Probing Noncentrosymmetric Domains in 3D Bulk 233 7.5 Further Reading for SFG 251 Practice Problems 251 References 253 8 Multivariate Data Analysis 257 8.1 Least Squares Analysis 258 8.2 Factor Analysis 261 8.3 Matrix Algebra for Principal Component Analysis (PCA) and Principal Component Regression (PCR) 263 8.4 Further Reading for Multivariate Analysis 281 Practice Problems 281 References 282 9 Thin Film Analysis via Reflectometry and Ellipsometry 283 9.1 Recap of Light Reflection and Transmission Principles 283 9.2 Reflectometry 285 9.3 Ellipsometry 288 9.4 Spectroscopic Ellipsometry (SE) 295 9.5 Mueller Matrix Ellipsometry (MME) 306 9.6 Further Reading for Ellipsometry 314 Practice Problems 314 References 315 10 Topography Analysis via Light Reflection 317 10.1 White Light Interferometry (WLI) 317 10.2 Surface Roughness 326 10.3 Further Reading of Optical Profilometry 328 Practice Problems 328 References 329 11 Topography Analysis via Scanning Probe 331 11.1 Tip-Sample Interactions in Atomic Force Microscopy (AFM) 331 11.2 Force Measurement Through Cantilever Deflection 339 11.3 Cantilever Oscillation in Noncontact and Tapping Mode AFM 341 11.4 Surface Deformation in Contact Mode AFM 345 11.5 Scanning AFM Probe 348 11.6 Material Properties Measured Along with Topography 357 11.7 Further Reading for AFM 362 Practice Problems 362 References 365 12 Mechanical Analysis via Indentation 369 12.1 Modulus, Hardness, and Toughness 369 12.2 Nanoindentation 371 12.3 Micro-indentation 375 12.4 Hidden Factors Affecting Indentation Measurement 379 12.5 Further Reading for Nanoindentation 388 Practice Problems 388 References 391 Index 393
Preface xi About the Companion Website xv 1 Introduction 1 1.1 Types of Surface Analysis 1 1.2 Why Is Surface Analysis Done in Vacuum? 1 1.3 Surface Energy 6 1.4 Relationship Between Surface Energy and Physical Properties 8 1.5 Measuring Surface Energy 10 1.6 Bulk Properties Affected by Surface Energy 14 1.7 Further Reading for Surface Contamination and Vacuum 16 Practice Problems 16 References 17 2 Elemental Analysis via X-ray Irradiation 19 2.1 Electron Emission upon X-ray Absorption 19 2.2 Instrumentation for X-ray Photoelectron Spectroscopy (XPS) 27 2.3 Qualitative Analysis with XPS 37 2.4 Quantitative Analysis with XPS 48 2.5 Depth Profiling with XPS 68 2.6 Chemical Analysis with X-ray Absorption Spectroscopy (XAS) 73 2.7 Further Reading for XPS 78 Practice Problems 79 References 84 3 Elemental Analysis via Electron Irradiation 89 3.1 Principle of Auger Electron Spectroscopy (AES) 89 3.2 Qualitative Analysis with AES 93 3.3 Quantitative Analysis with AES 96 3.4 Scanning Auger Mapping 97 3.5 Further Reading for AES 99 Practice Problems 100 References 100 4 Elemental Analysis via Ion Irradiation 103 4.1 Principle of Secondary Ion Mass Spectrometry (SIMS) 103 4.2 Qualitative Analysis with SIMS 106 4.3 Quantitative Analysis with SIMS 111 4.4 Further Reading for SIMS 112 Practice Problems 112 References 113 5 Light Propagation, Absorption, and Reflection 115 5.1 Propagation and Absorption of Electromagnetic Wave 116 5.2 Reflection/Refraction at Interface of Two Media 128 5.3 Further Reading for IR and Raman Spectroscopy 139 Practice Problems 139 References 139 6 Spectroscopic Analysis via IR Reflection and Transmission 141 6.1 Attenuated Total Reflectance Infrared (ATR-IR) Spectroscopy 143 6.2 Specular Reflection Infrared (SR-IR) Spectroscopy 151 6.3 Reflection Absorption Infrared Spectroscopy (RAIRS) 158 6.4 Brewster-Angle Transmission (BAT) Infrared Spectroscopy 176 6.5 Diffuse-Reflectance Infrared Fourier Transform (DRIFT) Spectroscopy 180 6.6 IR Spectroscopic Imaging 183 6.7 Further Reading for Surface-Sensitive IR Spectroscopy 192 Practice Problems 192 References 193 7 Buried Interface Analysis via Nonlinear Spectroscopy 197 7.1 Nonlinear vs. Linear Optical Responses 197 7.2 Sum Frequency Generation (SFG) Process 200 7.3 SFG Spectroscopy Probing 2D Interface 211 7.4 SFG Spectroscopy Probing Noncentrosymmetric Domains in 3D Bulk 233 7.5 Further Reading for SFG 251 Practice Problems 251 References 253 8 Multivariate Data Analysis 257 8.1 Least Squares Analysis 258 8.2 Factor Analysis 261 8.3 Matrix Algebra for Principal Component Analysis (PCA) and Principal Component Regression (PCR) 263 8.4 Further Reading for Multivariate Analysis 281 Practice Problems 281 References 282 9 Thin Film Analysis via Reflectometry and Ellipsometry 283 9.1 Recap of Light Reflection and Transmission Principles 283 9.2 Reflectometry 285 9.3 Ellipsometry 288 9.4 Spectroscopic Ellipsometry (SE) 295 9.5 Mueller Matrix Ellipsometry (MME) 306 9.6 Further Reading for Ellipsometry 314 Practice Problems 314 References 315 10 Topography Analysis via Light Reflection 317 10.1 White Light Interferometry (WLI) 317 10.2 Surface Roughness 326 10.3 Further Reading of Optical Profilometry 328 Practice Problems 328 References 329 11 Topography Analysis via Scanning Probe 331 11.1 Tip-Sample Interactions in Atomic Force Microscopy (AFM) 331 11.2 Force Measurement Through Cantilever Deflection 339 11.3 Cantilever Oscillation in Noncontact and Tapping Mode AFM 341 11.4 Surface Deformation in Contact Mode AFM 345 11.5 Scanning AFM Probe 348 11.6 Material Properties Measured Along with Topography 357 11.7 Further Reading for AFM 362 Practice Problems 362 References 365 12 Mechanical Analysis via Indentation 369 12.1 Modulus, Hardness, and Toughness 369 12.2 Nanoindentation 371 12.3 Micro-indentation 375 12.4 Hidden Factors Affecting Indentation Measurement 379 12.5 Further Reading for Nanoindentation 388 Practice Problems 388 References 391 Index 393
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