"Demystifies the concept of system-level ESD and details its difference from the conventional component level ESD design and testing. Describes the protection elements and designs and focuses on the "co-design," an optimization methodology to address both issues in the same design space"--
"Demystifies the concept of system-level ESD and details its difference from the conventional component level ESD design and testing. Describes the protection elements and designs and focuses on the "co-design," an optimization methodology to address both issues in the same design space"--
Charvaka Duvvury, formerly Texas Instruments, USA Charvaka Duvvury, formerly of Texas Instruments, is currently working as a technical consultant on ESD design methods and ESD qualification support. He has published over 150 technical papers and holds more than 70 patents. He is a co-founder and co-chair of the Industry Council on ESD Target Levels and has been serving as Board of Director of the ESDA since 1997 promoting university education and research in ESD technology. Harald Gossner, Intel, Germany Harald Gossner is Senior Principal Engineer at Intel where for 15 years he has worked on the development of ESD protection concepts with Siemens and Infineon Technologies. In 2010 he has joined Intel Mobile Communications overseeing the development of robust mobile systems. Harald has authored and co-authored more than 100 technical papers and one book in the field of ESD and device physics. He holds more than 60 patents on the same topic. In 2006 he became cofounder and co-chair of the Industry Council on ESD Target Levels.
Inhaltsangabe
Chapter 1 Introduction Charvaka Duvvury
Chapter 2 Component Versus System Level ESD Charvaka Duvvury and Harald Gossner
Chapter 3 System Level Testing for ESD Susceptibility Michael Hopkins
Chapter 4 PCB/IC Co-Design Concepts for SEED Harald Gossner and Charvaka Duvvury
Chapter 5 Hard Fails & PCB Protection Devices Robert Ashton
Chapter 6 Soft Fail and PCB design measures David Pommerenke and Pratik Maheshwari
Chapter 7 ESD in Mobile Devices Matti Uusimäki
Chapter 8 ESD for Automotive Applications Wolfgang Reinprecht
Chapter 9 Futire Applications of SEED Methodology Harald Gossner and Charvaka Duvvury
Chapter 10 Co-Design Tradeoffs: Balancing Robustness, Performance and Cost Jeffery C. Dunnihoo
