Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits

The System on Chip Approach
Herausgeber: Sun, Yichuang

• Broschiertes Buch

Produktbeschreibung

This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book reports systematically the state of the arts and future research directions of those areas.

---

Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.

Produktdetails

• Verlag: Institution of Engineering & Technology
• Seitenzahl: 416
• Erscheinungstermin: 30. Mai 2008
• Englisch
• Abmessung: 234mm x 156mm x 22mm
• Gewicht: 623g
• ISBN-13: 9780863417450
• ISBN-10: 0863417450
• Artikelnr.: 40189000

Inhaltsangabe

* Chapter 1: Fault diagnosis of linear and non-linear analogue circuits
* Chapter 2: Symbolic function approaches for analogue fault diagnosis
* Chapter 3: Neural-network-based approaches for analogue circuit fault
diagnosis
* Chapter 4: Hierarchical/decomposition techniques for large-scale
analogue diagnosis
* Chapter 5: DFT and BIST techniques for analogue and mixed-signal test
* Chapter 6: Design-for-testability of analogue filters
* Chapter 7: Test of A/D converters: From converter characteristics to
built-in self-test proposals
* Chapter 8: Test of Sigma Delta converters
* Chapter 9: Phase-locked loop test methodologies: Current
characterization and production test practices
* Chapter 10: On-chip testing techniques for RF wireless transceiver
systems and components
* Chapter 11: Tuning and calibration of analogue, mixed-signal and RF
circuits