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Electronic applications are currently developed under
the reuse-based paradigm.
This design methodology presents several advantages
for the reduction of the design complexity, but
brings new challenges for the test of the final
circuit.
In this manuscript, the main problems of the test of
core-based systems are firstly identified and
the current solutions are discussed. Then, two
power-aware test planning approaches are proposed
aiming at reducing the test costs of a core-based
system by means of hardware reuse and integration of
the test planning into the design flow. The first
approach considers systems whose cores are connected
through a functional bus or using a point-to-point
model. The second approach considers the systems
built upon a network-on-chip (NoC) and proposes the
reuse of the NoC infrastructure to test the embedded
cores.
This book can be useful to students, researchers, DFT
practitioners, and VLSI designers that want an
overview of the testing of core-based systems and
that want to know the basics of the reuse of a
network-on-chip as test access mechanism.
the reuse-based paradigm.
This design methodology presents several advantages
for the reduction of the design complexity, but
brings new challenges for the test of the final
circuit.
In this manuscript, the main problems of the test of
core-based systems are firstly identified and
the current solutions are discussed. Then, two
power-aware test planning approaches are proposed
aiming at reducing the test costs of a core-based
system by means of hardware reuse and integration of
the test planning into the design flow. The first
approach considers systems whose cores are connected
through a functional bus or using a point-to-point
model. The second approach considers the systems
built upon a network-on-chip (NoC) and proposes the
reuse of the NoC infrastructure to test the embedded
cores.
This book can be useful to students, researchers, DFT
practitioners, and VLSI designers that want an
overview of the testing of core-based systems and
that want to know the basics of the reuse of a
network-on-chip as test access mechanism.