Kim H Pries, Jon M Quigley

Testing Complex and Embedded Systems

• Gebundenes Buch

Produktbeschreibung

Using combinatorial approaches, this book aims to motivate testers and testing organizations to perform meaningful testing. The text details essential planning activities prior to testing and describes how to scope the work and how to achieve a successful conclusion. Rather than presenting the entire continuum of testing for a particular product or design attribute, this volume focuses on boundary conditions. The authors provide various techniques that can be used to streamline testing and help identify problems before they occur, including turbocharged testing methods from Six Sigma. Coverage includes material on simulation and emulation.

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Produktdetails

• Verlag: Taylor & Francis Ltd (Sales)
• Seitenzahl: 320
• Erscheinungstermin: 8. Dezember 2010
• Englisch
• Abmessung: 234mm x 157mm x 23mm
• Gewicht: 590g
• ISBN-13: 9781439821404
• ISBN-10: 1439821402
• Artikelnr.: 35968811

Autorenporträt

Kim H. Pries, Jon M. Quigley

Inhaltsangabe

Does Your Testing Look Like This? Benefits of Improved Testing. Overview.
Basic Principles. The Question. Contradictory Perspectives of Testing. The
Use of Noise. How to Perform "Bad'' Tests. Documenting the Testing. Test
Administration. Advanced Concepts. Software Test Documentation.
Configuration Management. Software Testing. Systems Testing. Simulation and
Emulation. Span of Tests. Exit Criteria. Bibliography. Index.