Dieter Hogrefe / Anthony Wiles (eds.)

Testing of Communicating Systems

15th IFIP International Conference, TestCom 2003, Sophia Antipolis, France, May 26-28, 2003, Proceedings
Herausgegeben:Hogrefe, Dieter; Wiles, Anthony

• Broschiertes Buch

Produktbeschreibung

This volume contains the proceedings of TestCom 2003, the IFIP TC6/WG 6.1 International Conference on Testing of Communicating Systems, held in Sophia Antipolis, France, during May 26 28, 2003. TestCom denotes a series of int- national working conferences on testing communicating systems in the data and telecommunication domain. The conference provides a forum for researchers, vendors and users to review, discuss and learn about new approaches, concepts andexperiencesinthe?eldoftestingofcommunicatingsystems.Thisconference in particular focuses on new ways of testing for new-generation networks. TestCom2003isthe?fteenthinaseriesofannualmeetingssponsoredbyIFIP TC6/WG6.1.The14previousmeetingswereheldinVancouver,Canada(1988), Berlin, Germany (1989), McLean, USA (1990), Leidschendam, The Netherlands (1991), Montreal, Canada (1992), Pau, France (1993), Tokyo, Japan (1994), Evry, France (1995), Darmstadt, Germany (1996), Cheju Island, Korea (1997), Tomsk, Russia (1998), Budapest, Hungary (1999), Ottawa, Canada (2000), and Berlin, Germany (2002). The scope of the papers presented at TestCom 2003 covers interoperability testing, TTCN-3, automata-based testing, testing of next-generation networks, IPandUMTS,testsystemsandtools,testspeci?cationdesignandmethodology, and industrial experience in testing communication systems. TheTestCom2003programconsistedof6technicalsessions,3positionsta- ment sessions, and a special session on interoperability testing. Three invited speeches gave an overview on actual trends in the testing and telecommuni- tion area and formulated requirements to the testing process. The proceedings contain the 19 regular papers accepted and presented at the conference. They were selected from 53 submitted papers in a careful selection procedure based on the assessment of three referees for each paper. The p- ceedings also include the text of the invited talk by Elaine Weyuker, Philippe Cousin, and Ana Cavalli.

Produktdetails

• Lecture Notes in Computer Science 2644
• Verlag: Springer / Springer Berlin Heidelberg / Springer, Berlin
• Artikelnr. des Verlages: 978-3-540-40123-0
• 2003
• Seitenzahl: 332
• Erscheinungstermin: 8. Mai 2003
• Englisch
• Abmessung: 235mm x 155mm x 19mm
• Gewicht: 503g
• ISBN-13: 9783540401230
• ISBN-10: 3540401237
• Artikelnr.: 23372388

Autorenporträt

Dieter Hogrefe, University of Göttingen, Germany / Anthony Wiles, ETSI, Sophia Antipolis, France

Inhaltsangabe

Keynote Speech I.- Prediction = Power.- Next Generation Networks, IP and UMTS.- UMTS Terminal Testing: A Practical Perspective.- Testing of 3G 1xEV-DV Stack - A Case Study.- Testing SIP Call Flows Using XML Protocol Templates.- Towards Modeling and Testing of IP Routing Protocols.- TTCN-3.- An Intuitive TTCN-3 Data Presentation Format.- The UML 2.0 Testing Profile and Its Relation to TTCN-3.- Realizing Distributed TTCN-3 Test Systems with TCI.- TimedTTCN-3 Based Graphical Real-Time Test Specification.- Keynote Speech II.- Interoperabolity Events Complementing Conformance Testing Activities.- Automata-Based Methodology.- Testing Transition Systems with Input and Output Testers.- Generating Checking Sequences for a Distributed Test Architecture.- Conformance of Distributed Systems.- An Automata-Based Approach to Property Testing in Event Traces.- Fault Diagnosis in Extended Finite State Machines.- A Guided Method for Testing Timed Input Output Automata.- Interoperability Testing.- Interoperability Testing Based on a Fault Model for a System of Communicating FSMs.- Framework and Model for Automated Interoperability Test and Its Application to ROHC.- Keynote Speech III.- TestNet: Let's Test Together!.- Test Design, Tools and Methodology.- An Open Framework for Managed Regression Testing.- TUB-TCI An Architecture for Dynamic Deployment of Test Components.- Fast Testing of Critical Properties through Passive Testing.