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  • Broschiertes Buch

Theory and Modeling of Cylindrical Nanostructures for High-Resolution Coverage Spectroscopy presents a new method for the evaluation of the coverage distribution of randomly deposited nanoparticles, such as single-walled carbon nanotubes and Ag nanowires over the substrate (oxides, SiO2, Si3N4, glass etc.), through height measurements performed by scanning probe microscopy techniques, like Atomic Force Microscopy (AFM).
The deposition of nanoparticles and how they aggregate in multiple layers over the substrate is one of the most important aspects of solution processed materials determining
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Produktbeschreibung
Theory and Modeling of Cylindrical Nanostructures for High-Resolution Coverage Spectroscopy presents a new method for the evaluation of the coverage distribution of randomly deposited nanoparticles, such as single-walled carbon nanotubes and Ag nanowires over the substrate (oxides, SiO2, Si3N4, glass etc.), through height measurements performed by scanning probe microscopy techniques, like Atomic Force Microscopy (AFM).

The deposition of nanoparticles and how they aggregate in multiple layers over the substrate is one of the most important aspects of solution processed materials determining device performances. The coverage spectroscopy method presented in the book is strongly application oriented and has several implementations supporting advanced surface analysis through many scanning probe microscopy techniques. Therefore this book will be of great value to both materials scientists and physicists who conduct research in this area.
Autorenporträt
Stefano Bottacchi currently works as a photonic networks consultant for Fraunhofer Heinrich Hertz Institute. He has previously worked for several leading research organizations, including Infineon Technologies AG, TriQuint Semiconductor and u2t Photonics AG. Dr. Bottacchi has published three books and many peer-reviewed articles, and he is a senior member of IEEE.