Theory of Image Formation - Blahut, Richard E
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Erscheint vorauss. 30. April 2025
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Fully revised and updated, the second edition of this classic text is the definitive guide to the mathematical models underlying imaging from sensed data. Building on fundamental principles derived from the two- and three-dimensional Fourier transform, and other key mathematical concepts, it introduces a broad range of imaging modalities within a unified framework, emphasising universal theoretical concepts over specific physical aspects. This expanded edition presents new coverage of optical-coherence microscopy, electron-beam microscopy, near-field microscopy, and medical imaging modalities…mehr

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Produktbeschreibung
Fully revised and updated, the second edition of this classic text is the definitive guide to the mathematical models underlying imaging from sensed data. Building on fundamental principles derived from the two- and three-dimensional Fourier transform, and other key mathematical concepts, it introduces a broad range of imaging modalities within a unified framework, emphasising universal theoretical concepts over specific physical aspects. This expanded edition presents new coverage of optical-coherence microscopy, electron-beam microscopy, near-field microscopy, and medical imaging modalities including MRI, CAT, ultrasound, and the imaging of viruses, and introduces additional end-of-chapter problems to support reader understanding. Encapsulating the author's fifty years of experience in the field, this is the ideal introduction for senior undergraduate and graduate students, academic researchers, and professional engineers across engineering and the physical sciences.
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Autorenporträt
Richard E. Blahut is the Emeritus Henry Magnuski Professor in the Department of Electrical and Computer Engineering at the University of Illinois, Urbana-Champaign, having served as the Department Head from 2001 to 2008. He has authored a series of advanced textbooks on the mathematical aspects of theoretical informatics, is a member of the US National Academy of Engineering, and a Fellow of the Institute of Electrical and Electronics Engineers (IEEE).