This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. . Most up-to-date coverage of design for testability. . Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. . Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. . Lecture slides and exercise solutions for all chapters are now available. . Instructors are also…mehr
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. . Most up-to-date coverage of design for testability. . Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. . Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. . Lecture slides and exercise solutions for all chapters are now available. . Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.
Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).
Inhaltsangabe
Chapter 1 Introduction Chapter 2 Design for Testability Chapter 3 Logic and Fault Simulation Chapter 4 Test Generation Chapter 5 Logic Built In Self Test Chapter 6 Test Compression Chapter 7 Logic Diagnosis Chapter 8 Memory Testing and Built In Self Test Chapter 9 Memory Diagnosis and Built In Self Repair Chapter 10 Boundary Scan and Core Based Testing Chapter 11 Analog and Mixed Signal Testing Chapter 12 Test Technology Trends in the Nanometer Age
Chapter 1 Introduction Chapter 2 Design for Testability Chapter 3 Logic and Fault Simulation Chapter 4 Test Generation Chapter 5 Logic Built In Self Test Chapter 6 Test Compression Chapter 7 Logic Diagnosis Chapter 8 Memory Testing and Built In Self Test Chapter 9 Memory Diagnosis and Built In Self Repair Chapter 10 Boundary Scan and Core Based Testing Chapter 11 Analog and Mixed Signal Testing Chapter 12 Test Technology Trends in the Nanometer Age
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