Stanley L Hurst

VLSI Testing

Digital and Mixed Analogue/Digital Techniques

• Gebundenes Buch

Produktbeschreibung

A comprehensive introduction and reference for all aspects of IC testing, this book includes all of the basic concepts and theories necessary for advanced students, from practical test strategies and industrial practice, to the economic and managerial aspects of testing.

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Produktdetails

• Verlag: Institution of Engineering & Technology
• Seitenzahl: 552
• Erscheinungstermin: 30. Juni 1998
• Englisch
• Abmessung: 240mm x 161mm x 34mm
• Gewicht: 994g
• ISBN-13: 9780852969014
• ISBN-10: 0852969015
• Artikelnr.: 50911675

Autorenporträt

Stanley L Hurst began his industrial career with Westinghouse Brake and Signal Company before leaving for academia in the 1960s. Initially with the Bristol College of Science and Technology and subsequently with the University of Bath, he specialised in digital electronic teaching and research, particularly in custom microelectronics and testing. In 1985 he was recruited by the Open University to produce educational material on these subjects for industry and continuing education courses. He is currently Academic Editor, Circuits and Systems, of the Microelectronics Journal. He holds the MSc(Eng) and PhD from the University of London, the DSc from the University of Bath, and is the author of some 50 papers and eight books in his subject area.

Inhaltsangabe

Chapter 1: Introduction
Chapter 2: Faults in digital circuits
Chapter 3: Digital test pattern generation
Chapter 4: Signatures and self test
Chapter 5: Structured design for testability (DFT) techniques
Chapter 6: Testing of structured digital circuits and microprocessors
Chapter 7: Analogue testing
Chapter 8: Mixed analogue/digital system test
Chapter 9: The economics of test and final overall summary
Appendices