Myeongkyu Lee

X-Ray Diffraction for Materials Research

From Fundamentals to Applications

• Gebundenes Buch

Produktbeschreibung

This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how

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Produktdetails

• Verlag: Apple Academic Press
• Seitenzahl: 302
• Erscheinungstermin: 11. Februar 2016
• Englisch
• Abmessung: 231mm x 155mm x 23mm
• Gewicht: 540g
• ISBN-13: 9781771882989
• ISBN-10: 1771882980
• Artikelnr.: 43776368

Autorenporträt

Lee, Myeongkyu

Inhaltsangabe

X
Rays and Crystal Geometry. Electromagnetic Waves and X
Rays. Geometry of Crystals. Interference and Diffraction. Theory of X
Ray Diffraction. Directions of X
Ray Diffraction. Intensities of X
Ray Diffraction. Applications of X
Ray Diffraction. Characterization of Thin Films by X
Ray Diffraction. Laue Method And Determination of Single Crystal Orientation. Powder Diffraction. Index.