X-Ray Diffraction
187,99 €
inkl. MwSt.
Versandkostenfrei*
Versandfertig in über 4 Wochen
payback
94 °P sammeln
  • Gebundenes Buch

Developments in nature and materials sciences are based on the investigation and understanding of nano-scaled properties of matter. This book presents the developments in X-ray diffraction and scattering methods.
High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and…mehr

Andere Kunden interessierten sich auch für
Produktbeschreibung
Developments in nature and materials sciences are based on the investigation and understanding of nano-scaled properties of matter. This book presents the developments in X-ray diffraction and scattering methods.
High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.
Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.
Autorenporträt
Oliver H. Seeck graduated from the University of Kiel (Germany), studying the structure of thin layers and surfaces. He continued this research as post-doc at the Advanced Photon Source in Chicago. Thereafter, he worked as a scientist at Forschungszentrum Jülich, managing a diffraction beamline at DESY, Germany, and became a DESY faculty member in 2005. Until spring 2014, Seeck was responsible for the diffraction beamline P08 at the third-generation synchrotron radiation source PETRA III. He now heads the PETRA III experiments division. Bridget M. Murphy moved to Daresbury Synchrotron Radiation Source (CCLRC) in the UK upon completing her master's at Dublin City University in Ireland. Working there as a beamline scientist, she specialized in x-ray scattering techniques. She moved to the University of Kiel to research phase transitions in strongly correlated systems and obtained her PhD in 2004. She continued to develop x-ray methods and investigating structure and dynamics of solid and liquid interfaces. At present, she is a faculty member at the University of Kiel.