Arsen Aboyan

X-Ray Interferometric Methods for Investigating Crystal Imperfections

• Broschiertes Buch

Produktbeschreibung

The monograph is devoted to the development, preparation and testing of X-ray train meter and measurement of X-ray wave train length using this instrument; development of X-ray experiments similar to Sagnac and Michelson - Gale experiments, as well as the luminous Fiseau experiment, permitting to detect the influence of the moving media and sources on X-ray interference patterns; to the development of X-ray diffraction stereometric topography of crystal imperfections, using multiple interferometers; to the detection and investigation of structural distortions of semiconducting crystals caused by external influences; X-ray interferometry technique for measuring the refractive indices of some solid bodies and liquids, and a high sensitivity radiographic method for studying the uniformity of density distribution in substances are created. The book is intended for a wide range of readers - scientists, engineers and technicians, undergraduate and graduate students, involved in research in the fields of solid state physics, material science, as well as it may be of use to those involved in the manufacture of semiconducting devices.

Produktdetails

• Verlag: LAP Lambert Academic Publishing
• Seitenzahl: 244
• Erscheinungstermin: 2. November 2016
• Englisch
• Abmessung: 220mm x 150mm x 15mm
• Gewicht: 382g
• ISBN-13: 9783330001602
• ISBN-10: 3330001607
• Artikelnr.: 47108959

Autorenporträt

Arsen Aboyan is a Member of the Academy of Sciences of New-York City (1994). Professor of NPUA. He is an author of investigations in the field of crystal imperfections by means of X-ray interferometric methods, an author of a number of tutorials. He was recognized the Man of the Year by the ABI.He was also awarded a gold medal of NPUA in 2013.