P. B. Kenway, P. J. Duke

X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK

• Gebundenes Buch

Produktbeschreibung

The first ICXOM congress held in Cambridge was the brain-child of Dr. Ellis Cosslett, founder of the Electron Optics Section of the Cavendish Laboratory. Dr. Cosslett pioneered research in x-ray optics and microanalysis and retained a close interest in all subject applications for this area of research, including physics, materials science, chemistry, and biology. X-Ray Optics and Microanalysis 1992 was held in his memory. At a special symposium, friends and colleagues reviewed the present status of research in x-ray optics and microanalysis. S.J. Pennycook of Oak Ridge National Laboratory, D.B. Williams of Lehigh University, J.A. Venables et al. of Arizona State University and Sussex University, and C. Jacobsen et al. of SUNY, Stony Brook are among the researchers whose papers are included in this volume.

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Produktdetails

• Verlag: CRC Press
• Seitenzahl: 680
• Erscheinungstermin: 1. März 1993
• Englisch
• Abmessung: 240mm x 161mm x 41mm
• Gewicht: 1176g
• ISBN-13: 9780750302555
• ISBN-10: 0750302550
• Artikelnr.: 21960185

Autorenporträt

P.B. Kenway and P. J. Duke

Inhaltsangabe

Cosslett symposium: (speakers T Mulvey, W C Nixon, R W Horne, A Glauert, J
V Long, P Duncumb, A Boyde, P W Hawkes). Invited papers: Recent advances in
electron microprobe analysis (S J B Reed); Database and review of
quantitative EMPA procedures (K F J Heinrich); Atomic resolution incoherent
imaging and analysis with the STEM (S J Pennycook et al); The quantitative
analysis of thin specimens (D B Williams); Imaging surfaces with scanning
tunnelling and scanning force microscopes (H-J Butt); Aspects of 3-D
imaging, display and measurement in light and scanning electron microscopy
(A Boyde); Developments in image processing (P W Hawkes). Never mind the
baby, how about the bath water?: insights from the secondary electron
background in electron spectroscopy (J A D Matthew et al); The use of
integrated circuits for position-sensitive detection (J Comer et al);
Surface studies in UHV-SEM and STEM (J A Venables et al); Electron
spectroscopy at high spatial resolution (P Kruit); The performance of the
photoelectron spectromicroscope at low and high energies (D W Turner and I
R Plummer); Laser-plasma XUV sources, advances in performance (F Bijkerk);
X-ray microprobes based on Bragg-Fresnel crystal optics for high energy
X-rays (V V Aristov et al); X-ray holography at the National Synchrotron
Ligh Source (C Jacobsen et al); Review on the development of cone-beam
X-ray microtomography (P C Cheng et al); The opportunities and challenges
of using high brilliance X-ray synchotron sources (P Pattison); Present
status of and future prospects for synchotron-based microtechniques that
utilize X-ray fluorescence, absorption spectroscopy, diffraction and
tomography (J V Smith); Properties and applications of soft x-ray
undulators in structural and microstructural studies of the surfaces of
materials (D P Woodruff); Review of EPMA and future developments (K F J
Heinrich).