Metin Tolan

X-Ray Scattering from Soft-Matter Thin Films

Materials Science and Basic Research

• Broschiertes Buch

Produktbeschreibung

The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science. They are also very exciting with respect to fundamental questions: In thin films, liquids and polymers may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool to investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.

Produktdetails

• Springer Tracts in Modern Physics 148
• Verlag: Springer / Springer Berlin Heidelberg / Springer, Berlin
• Artikelnr. des Verlages: 978-3-662-14218-9
• Softcover reprint of the original 1st ed. 1999
• Seitenzahl: 212
• Erscheinungstermin: 3. Oktober 2013
• Englisch
• Abmessung: 235mm x 155mm x 12mm
• Gewicht: 346g
• ISBN-13: 9783662142189
• ISBN-10: 366214218X
• Artikelnr.: 39492845

Autorenporträt

Metin Tolan, 1965 als Sohn deutsch-türkischer Eltern in Oldenburg geboren, ist er seit 2001 Professor für Experimentelle Physikan der Technischen Universität Dortmund. Seine Leidenschaften sind Physik, Fußball und James-Bond-Filme. Die Vorträge, die er über diese aufregende Mischung hält, werden vom Publikum gefeiert.

Inhaltsangabe

Reflectivity of x-rays from surfaces.- Reflectivity experiments.- Advanced analysis techniques.- Statistical description of interfaces.- Off-specular scattering.- X-ray scattering with coherent radiation.- Closing remarks.

Rezensionen

"The book is well referenced and clearly conveys materials systems and behavior that are amenable to characterization by thin-film scattering techniques. It should be an asset to any research group beginning, or currently involved in, the characterization of thin films by x-ray diffraction."
Physics Today, 2000/2