This book explores in depth the analysis of errors in X-ray Absorption Fine Structure (XAFS), essential for guaranteeing the reliability of experimental results. The first chapter defines XAFS errors, distinguishing between statistical and systematic errors, and examines their impact on results. The second chapter focuses on statistical errors, explaining how to estimate them using various methods such as smooth function subtraction and Poisson statistics. The third chapter deals with systematic errors, identifying their sources and proposing methods for estimating and managing them. The fourth chapter deals with the estimation and reporting of confidence limits, describing standardized procedures for assessing the quality of fits. Finally, the fifth chapter analyzes fit quality and signal-to-noise ratio, offering methods for evaluating S/N and interpreting results. This practical guide is designed to improve accuracy and transparency in XAFS data analysis.
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