Charles E. Stroud

A Designer's Guide to Built-In Self-Test (eBook, PDF)

• Format: PDF

Produktbeschreibung

A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.

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Produktdetails

• Verlag: Springer US
• Seitenzahl: 320
• Erscheinungstermin: 27. Dezember 2005
• Englisch
• ISBN-13: 9780306475047
• Artikelnr.: 37807296

Inhaltsangabe

An Overview of BIST.- Fault Models, Detection, and Simulation.- Design for Testability.- Test Pattern Generation.- Output Response Analysis.- Manufacturing and System-Level Use of BIST.- Built-In Logic Block Observer.- Pseudo-Exhaustive BIST.- Circular BIST.- Scan-Based BIST.- Non-Intrusive BIST.- BIST for Regular Structures.- BIST for FPGAs and CPLDs.- Applying Digital BIST to Mixed-Signal Systems.- Merging BIST and Concurrent Fault Detection.