This volume is aimed at diffusion non-specialists who may find at some time that they need a handy guide to the tracer diffusional behaviour of one element in another element. Those working on new coating, or other commercial processes, might for example need basic diffusion data in order to decide on the initial settings of the new-process parameters. Theoreticians who are seeking empirical trends in diffusivities may also find the contents to be of great interest.
The information is presented in the form of abstracts, gathered mainly from the 241-volume series of Defect and Diffusion Forum (and its antecedents); with their coverage of 38 years of diffusion research up to 2004. In the case of certain elements, such as silicon, even earlier data are included.
The information is presented in the form of abstracts, gathered mainly from the 241-volume series of Defect and Diffusion Forum (and its antecedents); with their coverage of 38 years of diffusion research up to 2004. In the case of certain elements, such as silicon, even earlier data are included.
Dieser Download kann aus rechtlichen Gründen nur mit Rechnungsadresse in A, B, BG, CY, CZ, D, DK, EW, E, FIN, F, GR, HR, H, IRL, I, LT, L, LR, M, NL, PL, P, R, S, SLO, SK ausgeliefert werden.