Advances in Electronic Testing (eBook, PDF)

Challenges and Methodologies
Redaktion: Gizopoulos, Dimitris

• Format: PDF

Produktbeschreibung

This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.

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Produktdetails

• Verlag: Springer New York
• Seitenzahl: 412
• Erscheinungstermin: 22. Januar 2006
• Englisch
• ISBN-13: 9780387294094
• Artikelnr.: 37288389

Autorenporträt

Dimitris Gizopoulos, University of Piraeus, Greece

Inhaltsangabe

Foreword.- Preface.- Contributing Authors.- Dedication.- Defect-Oriented Testing.- Failure Mechanisms and Testing in Nanometer Technologies.- Silicon Debug.- Delay Testing.- High-Speed Digital Test Interfaces.- DFT-Oriented, Low-Cost Testers.- Embedded Cores and System-on-Chip Testing.- Embedded Memory Testing.- Mixed-Signal Testing and DfT.- RF Testing.- Loaded Board Testing.- Index.

Rezensionen

"There is a definite need for documenting the advances in testing ... I find the work of this edited volume by Dimitris Gizopoulos and his team of authors to be significant and timely. [...] the book provides, besides novel test methodologies, a collective insight into the emerging aspects of testing. This, I think, is beneficial to practicing engineers and researchers both of whom must stay at the forefront of technology. [...] This latest addition to the Frontiers Series is destined to serve an important role."

From the Foreword by Vishwani D. Agrawal, Consulting Editor

Frontiers in Electronic Testing Book Series