Advances in Imaging and Electron Physics (eBook, ePUB)

Redaktion: Hÿtch, Martin; Hawkes, Peter W.

• Format: ePub

Produktbeschreibung

Advances in Imaging and Electron Physics, Volume 224 highlights new advances in the field, with this new volume presenting interesting chapters on Measuring elastic deformation and orientation gradients by scanning electron microscopy - conventional, new and emerging methods, Development of an alternative global method with high angular resolution, Implementing the new global method, Numerical validation of the method and influence of optical distortions, and Applications of the method.

• Provides the authority and expertise of leading contributors from an international board of authors
• Presents the latest release in the Advances in Imaging and Electron Physics series
• Updated release includes the latest information on Measuring elastic deformation and orientation gradients by scanning electron microscopy - conventional, new and emerging methods

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Produktdetails

• Verlag: Elsevier Science & Techn.
• Seitenzahl: 266
• Erscheinungstermin: 23. August 2022
• Englisch
• ISBN-13: 9780323988643
• Artikelnr.: 65441819

Autorenporträt

Dr Martin Hÿtch, serial editor for the book series "Advances in Imaging and Electron Physics (AIEP)?, is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on "Quantitative high-resolution transmission electron microscopy (HRTEM)?, joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Mi

croscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.

Inhaltsangabe

Preface
Martin Hÿtch and Peter W. Hawkes
1. Measuring elastic strains and orientation gradients by scanning electron microscopy: Conventional and emerging methods
Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy
2. Development of a global homography-based approach for high-angular resolution in the SEM
Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy
3. Implementing the homography-based global approach
Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy
4. Numerical validation and influence of optical distorsions on accuracy
Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy
5. Applications of the method
Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger,Vincent Taupin and Emmanuel Bouzy
6. Spin wave physics: The nonlinear spin wave-electromagnetic interaction and implications for high frequency devices
Clifford M. Krowne