Analog Devices and Circuits 2 (eBook, ePUB)

Analog Circuits
Redaktion: Gontrand, Christian

• Format: ePub

Produktbeschreibung

At the end of the Second World War, a new technological trend was born: integrated electronics. This trend relied on the enormous rise of integrable electronic devices. Analog Devices and Circuits is composed of two volumes: the first deals with analog components, and the second with associated analog circuits. The goal here is not to create an overly comprehensive analysis, but rather to break it down into smaller sections, thus highlighting the complexity and breadth of the field. This first volume, after a brief history, describes the two main devices, namely bipolar transistors and MOS, with particular importance given to the modeling aspect. In doing so, we deal with new devices dedicated to radio frequency, which touches on nanoelectronics. We will also address some of the notions related to quantum mechanics. Finally, Monte Carlo methods, by essence statistics, will be introduced, which have become more and more important since the middle of the twentieth century. The second volume deals with the circuits that "use" the analog components that were introduced in Volume 1. Here, a particular emphasis is placed on the main circuit: the operational amplifier.

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Produktdetails

• Verlag: Jossey-Bass
• Seitenzahl: 272
• Erscheinungstermin: 23. Februar 2024
• Englisch
• ISBN-13: 9781394276752
• Artikelnr.: 70072621

Autorenporträt

Christian Gontrand is a Professor at INL/INSA Lyon, France, focusing on 3D circuits. He was formerly a Head Professor in the Smart Power Integration team at Laboratoire Ampère and had technical charge of the CIMIRLY from 1988 to 1996. His current research focuses on Artificial Intelligence applied to health.

Inhaltsangabe

Preface ix
Chapter 1 On Analog Circuits 1
1.1 Introduction: miscellaneous 1
1.1.1 SPICE 1
1.1.2 Technologies: conception-aided design 5
1.1.3 Resistor technologies 12
1.2 A simple but realistic amplifier circuit: the bipolar junction
transistor with a common emitter 19
1.2.1 Small signal equivalent schematic of common feedback emitter with
base bridge 20
1.2.2 Current gain calculation 21
1.3 Integrated circuit design 22
1.4 Current sources 23
1.4.1 Simple current sources 23
1.4.2 Wildar current source 24
1.4.3 Wilson current source 24
1.4.4 Current source and voltage source 27
1.4.5 Advantages and disadvantages of both sources: one phase and Wildar 28
1.4.6 Cascode-connected current source 33
1.4.7 Single current source 34
1.4.8 Improved Wilson current source 35
1.5 A historic circuit: the 741 operational amplifier 35
1.5.1 Active charge 37
1.5.2 741 description 38
1.5.3 Continuous analysis 39
1.5.4 Analysis of 741 small signals 45
1.5.5 The third stage 52
1.5.6 Considering the effect of the second order: computer analysis 57
1.6 Electric simulator 59
1.6.1 Analysis of steady-state linear circuits 61
1.6.2 Transitional analysis 66
1.6.3 Nonlinear system: Newton-Raphson method 71
1.7 Simulation of a system with several active devices 88
1.8 Basic analog functional blocks in (C)MOS technology 107
1.8.1 Common source NMOS transistors 107
1.8.2 Reminder on the general structure of the operational amplifier 118
1.9 Conclusion 146
Chapter 2 Noise and Interference in Mixed Circuits 147
2.1 Introduction 147
2.2 Ground or power supply noise and substrate coupling 148
2.2.1 Noise propagation in a silicon substrate 150
2.2.2 Simulation methodology 152
2.3 Noise in integrated oscillator circuits 160
2.3.1 Oscillator design considerations 160
2.3.2 VCO topography 161
2.3.3 Results and discussion 166
2.4 Sensitivity functions 171
2.5 New developments in impulse sensitivity function 177
2.5.1 Oscillators: brief recap of the theory 177
2.5.2 Pulse sensitivity function (with some recap) 181
2.5.3 Influence of digital blocks on analog blocks 193
Chapter 3 From 2D to 3D: Opportunities and Challenges 207
3.1 Introduction 207
3.2 3D integration 208
3.2.1 3D impedance extraction 215
3.2.2 Model validation 224
3.2.3 Interconnections: compact models 233
3.2.4 Validation: test structures 235
3.2.5 Numerical simulations 241
3.2.6 Prospects and future directions 248
3.3 Conclusion 249
References 251
Index 253