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This textbook is appropriate for use in graduate-level curricula in analog to digital conversion, as well as for practicing engineers in need of a state-of-the-art reference on data converters. It discusses various analog-to-digital conversion principles, including sampling, quantization, reference generation, nyquist architectures and sigma-delta modulation. This book presents an overview of the state-of-the-art in this field and focuses on issues of optimizing accuracy and speed, while reducing the power level.
This new, second edition emphasizes novel calibration concepts, the specific
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Produktbeschreibung
This textbook is appropriate for use in graduate-level curricula in analog to digital conversion, as well as for practicing engineers in need of a state-of-the-art reference on data converters. It discusses various analog-to-digital conversion principles, including sampling, quantization, reference generation, nyquist architectures and sigma-delta modulation. This book presents an overview of the state-of-the-art in this field and focuses on issues of optimizing accuracy and speed, while reducing the power level.

This new, second edition emphasizes novel calibration concepts, the specific requirements of new systems, the consequences of 45-nm technology and the need for a more statistical approach to accuracy. Pedagogical enhancements to this edition include more than twice the exercises available in the first edition, solved examples to introduce all key, new concepts and warnings, remarks and hints, from a practitioner's perspective, wherever appropriate. Considerable background information and practical tips, from designing a PCB, to lay-out aspects, to trade-offs on system level, complement the discussion of basic principles, making this book a valuable reference for the experienced engineer.

  • Covers the most relevant developments in analog-to-digital conversion, in a pedagogical framework suited for both graduate-level courses and professionals;
  • Updates the first edition of this book to include novel calibration concepts, the specific requirements of new systems, the consequences of 45-nm CMOS technology and some first results with metal-gate 28-nm technologies;
  • Emphasizes the need for a more statistical approach to accuracy,not only as a theoretical exercise, but also to calculate circuit (mal)function and design yield;
  • Provides insight on how to choose parameters for designing circuits, using extended examples of how to make that choice for an amplifier, a track-and-hold circuit, a full-flash converter, a conversion stage or a filter for sigma-delta modulator;
  • Includes more than twice the exercises of the first edition, as well as solved examples to help introduce each new concept.

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Autorenporträt
Marcel Pelgrom received his B.EE, M.Sc, and PhD from Twente University, Enschede, The Netherlands. In 1979, he joined Philips Research Laboratories, where his research has covered topics such as Charge Coupled Devices, MOS matching properties, analog-to-digital conversion, digital image correlation, and various analog building block techniques. He has headed several project teams, and was a team leader for high-speed analog-to-digital conversion. From 1996 until 2003, he was a department head for Mixed-Signal Electronics.

In addition to various activities concerning industry-academic relations, he is a research fellow in research on the edge of design and technology.

In 2003, he spent a sabbatical in Stanford University where he served as a consulting professor. Since 2007, he has been a member of the technical staff at NXP Semiconductors. Dr. Pelgrom was an IEEE Distinguished Lecturer, has written over 40 publications, three book chapters, and holds 28 US patents. He currently lectures in the Philips Training Department at Twente University and for MEAD Inc.