J. Patrick Meyer

Applied Measurement with jMetrik (eBook, PDF)

• Format: PDF

Produktbeschreibung

Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis.

---

Dieser Download kann aus rechtlichen Gründen nur mit Rechnungsadresse in A, B, BG, CY, CZ, D, DK, EW, E, FIN, F, GR, HR, H, IRL, I, LT, L, LR, M, NL, PL, P, R, S, SLO, SK ausgeliefert werden.

Produktdetails

• Verlag: Taylor & Francis
• Seitenzahl: 170
• Erscheinungstermin: 13. Juni 2014
• Englisch
• ISBN-13: 9781136294174
• Artikelnr.: 41074258

Autorenporträt

J. Patrick Meyer is an associate professor in the Curry School of Education at the University of Virginia

Inhaltsangabe

Preface. Acknowledgements. Chapter 1: Data Management. Chapter 2: Item
Scoring. Chapter 3: Test Scaling. Chapter 4: Item Analysis. Chapter 5:
Reliability. Chapter 6: Differential Item Functioning. Chapter 7: Rasch
Measurement. Chapter 8: Polytomous Rasch Models. Chapter 9: Plotting Item
and Test Characteristics. Chapter 10: IRT Scale Linking and Score Equating.
References. Appendix