J. Patrick Meyer

Applied Measurement with jMetrik (eBook, PDF)

• Format: PDF

Produktbeschreibung

Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis.

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Produktdetails

• Verlag: Taylor & Francis
• Seitenzahl: 170
• Erscheinungstermin: 13. Juni 2014
• Englisch
• ISBN-13: 9781136294174
• Artikelnr.: 41074258

Autorenporträt

J. Patrick Meyer is an associate professor in the Curry School of Education at the University of Virginia

Inhaltsangabe

Preface. Acknowledgements. Chapter 1: Data Management. Chapter 2: Item
Scoring. Chapter 3: Test Scaling. Chapter 4: Item Analysis. Chapter 5:
Reliability. Chapter 6: Differential Item Functioning. Chapter 7: Rasch
Measurement. Chapter 8: Polytomous Rasch Models. Chapter 9: Plotting Item
and Test Characteristics. Chapter 10: IRT Scale Linking and Score Equating.
References. Appendix

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Preface. Acknowledgements. Chapter 1: Data Management. Chapter 2: Item Scoring. Chapter 3: Test Scaling. Chapter 4: Item Analysis. Chapter 5: Reliability. Chapter 6: Differential Item Functioning. Chapter 7: Rasch Measurement. Chapter 8: Polytomous Rasch Models. Chapter 9: Plotting Item and Test Characteristics. Chapter 10: IRT Scale Linking and Score Equating. References. Appendix