M. L Jenkins, M. A Kirk

Characterisation of Radiation Damage by Transmission Electron Microscopy (eBook, ePUB)

• Format: ePub

Produktbeschreibung

This book details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. It focuses on the methods used to characterize small point-defect clusters, such as dislocation loops, because the coverage in general microscopy textbooks is limited and omits many of the problems associated with the analysis of these defects. The book also describes in situ, high-resolution, and analytical techniques. Techniques are illustrated with examples, providing a solid overview of the contribution of TEM to radiation damage mechanisms.

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Produktdetails

• Verlag: Taylor & Francis
• Erscheinungstermin: 21. November 2000
• Englisch
• ISBN-13: 9781040205860
• Artikelnr.: 72538621