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  • Format: ePub

"An invaluable reference for students, scientists, and engineers in the field of charged particle beams." Chiping Chen, Ph.D., Principal Research Scientist, MIT Detailed enough for a text and sufficiently comprehensive for a reference, this volume addresses topics vital to understanding high-power accelerators and high-brightness charged particle beams. The unified treatment employs physical models to introduce new insights into beam physics and provides students with the critical skills necessary for problem-solving. Chapter-length topics include beam emittance, beam-generated forces,…mehr

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Produktbeschreibung
"An invaluable reference for students, scientists, and engineers in the field of charged particle beams." Chiping Chen, Ph.D., Principal Research Scientist, MIT
Detailed enough for a text and sufficiently comprehensive for a reference, this volume addresses topics vital to understanding high-power accelerators and high-brightness charged particle beams. The unified treatment employs physical models to introduce new insights into beam physics and provides students with the critical skills necessary for problem-solving.
Chapter-length topics include beam emittance, beam-generated forces, electron and ion guns, high-power pulsed electron and ion diodes, paraxial beam transport with space charge, high-current electron beam transport under vacuum, and ion beam neutralization. Other chapters examine electron beams in plasma, transverse instabilities, longitudinal instabilities, and generation of radiation with electron beams.

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Autorenporträt
Stanley Humphries, Jr., is Professor Emeritus in the Electrical and Computer Engineering Department at the University of New Mexico. He is also the principal consultant at Field Precision, Inc., in Albuquerque, New Mexico, whose clients include Los Alamos Laboratory.