Michael J. Luvalle, Bruce G. Lefevre, Sirraman Kannan

Design and Analysis of Accelerated Tests for Mission Critical Reliability (eBook, PDF)

• Format: PDF

Produktbeschreibung

This book presents innovative theory and methods for recognizing and handling the more complicated cases often encountered in practice. It integrates a physical understanding of underlying phenomena and the statistical modeling of observation "noise" to provide a single theoretical framework for accelerated testing. The treatment includes general approaches that can be used with various computational software packages and an explicit computing environment in S-PLUS, numerous worked examples, end-of-chapter exercises, and chapter appendices containing technical and theoretical details. Source code written by the authors is included and available for download from the CRC Web site.

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Produktdetails

• Verlag: Taylor & Francis
• Seitenzahl: 248
• Erscheinungstermin: 27. April 2004
• Englisch
• ISBN-13: 9780203492031
• Artikelnr.: 38159799

Autorenporträt

Michael J. LuValle, Bruce G. LeFevre, SirRaman Kannan