Electron and Ion Microscopy and Microanalysis (eBook, PDF)

Principles and Applications, Second Edition,
Redaktion: Murr, Lawrence E

• Format: PDF

Produktbeschreibung

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

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Produktdetails

• Verlag: Taylor & Francis
• Seitenzahl: 856
• Erscheinungstermin: 8. Oktober 2018
• Englisch
• ISBN-13: 9781482293357
• Artikelnr.: 58131233

Autorenporträt

Lawrence E. Murr

Inhaltsangabe

CHAPTER 1: FUNDAMENTAL PROPERTIES OF ELECTRONS AND IONS. CHAPTER 2:
ELECTRON EMISSION AND EMISSION AND IONIZATION MICROSCOPY. CHAPTER. 3:
ELECTRON AND ION OPTICS AND OPTICAL SYSTEMS. CHAPTER 4: ELECTRON AND ION
PROBE MICROANALYSIS. CHAPTER 5: ELECTRON AND ION MICROSCOPY OF SURFACES.
CHAPTER 6: ELECTRON DIFFRACTION. CHAPTER 7: TRANSMISSION ELECTRON
MICROSCOPY. CHAPTER 8: HIGH-VOLTAGE ELECTRON MICROSCOPY.