Sten Hellström

ESD - The Scourge of Electronics (eBook, PDF)

• Format: PDF

Produktbeschreibung

This book deals with the influence of electrostatic discharges upon electronic components and systems and how to avoid it. The nature and the generation of static electricity is described with historical notes. The interaction between ESD and electronics is penetrated. Simulation models are given and ESD-failures including so called latent failures accounted for. Other forms of perturbation as EMI, EMC and noise are outlined. The influence on the human organism by electrostatic and electromagnetic fields has also been paid attention. Thest models and ESD protection methods are important parts of the book. Reference is made to existing international norms on ESD, EMC etc. Estimates on cost and cost saving by protection are quoted. (Disbursement and gain.) The book is applicable for anyone engaged with modern electronics as designers, protection and service technicians as well as users of electronic systems. Educational purposes can also be suggested.

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Produktdetails

• Verlag: Springer Berlin Heidelberg
• Seitenzahl: 195
• Erscheinungstermin: 6. Dezember 2012
• Englisch
• ISBN-13: 9783642803024
• Artikelnr.: 53140126

Inhaltsangabe

List of contents.- 1 The Discovery of Static Electricity and Its Manifestation.- 1.1 Triboelectricity.- 1.2 The Induced Electricity ("Influence").- 1.3 Charge, Potential and Field.- 2 Relation to Electronics.- 2.1 Charging.- 2.2 Direct Electric Discharges.- 2.3 Self-Charging.- 2.4 Charging by Induction (Influence).- 2.5 Rolling Gates as ESD-Generators.- 2.6 Relation Between Charging - Discharging Processes and ESD-Simulation Models.- 3 ESD-Testing and Models.- 3.1 General.- 3.2 ESD-Simulation Models.- 3.3 Comparison between Different Models and the Components' Responses to Them.- 4 Susceptibility for ESD.- 4.1 Future Implications of ESD.- 4.2 Example of Determination of Susceptibility Level.- 5 Failure Analysis.- 5.1 General.- 5.2 Failure Manifestation.- 5.3 Failure Mode.- 5.4 Technical Failure Analysis Works.- 5.5 Cause of Failure and Failure Mechanisms.- 6 Latent Failures.- 6.1 Time Dependence and Event Dependence.- 6.2 Technology Dependence.- 6.3 III-V-Components.- 6.4 Polysilicon Resistors.- 6.5 Detection of Latent Failures.- 6.6 Consequences and Counteractions.- 7 Indirect ESD.- 7.1 E- and H-Field.- 7.2 Examples of Perturbation.- 7.3 Testing Methods and Norms.- 8 Other Types of Perturbations in Electronics.- 8.1 Noise.- 8.2 Perturbation from Transients.- 8.3 EMC.- 9 The Impact of Electric Fields and Electromagnetic Waves on the Organism.- 9.1 Computer Screens, TV-Sets etc.- 9.2 Electromagnetic Radiation Fields.- 10 Simulation Methods.- 10.1 Mathematical Approach.- 10.2 Simulation of Transients Across an pn-Junction.- 10.3 2D and 3D Simulations.- 11 Protection Methods - Antistatic Materials.- 11.1 General.- 11.2 Protection Circuits in Components.- 11.3 Design Rules Against the Impact of ESD.- 11.4 Antistatic Materials.- 11.5 Evaluation Methods forAntistatic Materials.- 11.6 The Localisation of Charges.- 11.7 Protection Program.- 11.8 Norms and Standard.- 11.9 Labels for Marking.- 12 Failure Frequency and Costs for ESD.- 12.1 Failure Occurrance.- 12.2 Cost of ESD-Failures.- 13 Index.- 14 References.