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Experimental solid mechanics is the study of materials to determine their physical properties. This study might include performing a stress analysis or measuring the extent of displacement, shape, strain and stress which a material suffers under controlled conditions. In the last few years there have been remarkable developments in experimental techniques that measure shape, displacement and strains and these sorts of experiments are increasingly conducted using computational techniques. Experimental Mechanics of Solids is a comprehensive introduction to the topics, technologies and methods of…mehr
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- Produktdetails
- Verlag: Wiley-IEEE Press
- Seitenzahl: 808
- Erscheinungstermin: 28. Februar 2012
- Englisch
- ISBN-13: 9781119994084
- Artikelnr.: 38257211
- Verlag: Wiley-IEEE Press
- Seitenzahl: 808
- Erscheinungstermin: 28. Februar 2012
- Englisch
- ISBN-13: 9781119994084
- Artikelnr.: 38257211
- Herstellerkennzeichnung Die Herstellerinformationen sind derzeit nicht verfügbar.
e Patterns. One Dimensional Case 388 13.3 Formation of Moir
e Patterns. Two Dimensional Case 390 13.4 Relationship of the Displacement Vector and the Strain Tensor Components 393 13.5 Properties of the Moire Fringes (Isothetic Lines) 395 13.6 Sections of the Surface of Projected Displacements 396 13.7 Singular Points and Singular Lines 401 13.8 Digital Moir
e 402 13.9 Equipment Required to Apply the Moir
e Method for Displacement and Strain Determination Utilizing Incoherent Illumination 412 13.10 Strain Analysis at the Sub-Micrometer Scale 419 13.11 Three Dimensional Moir
e 424 13.12 Dynamic Moir
e 426 References 432 14 Moir
e Method. Coherent Ilumination 435 14.1 Introduction 435 14.2 Moir
e Interferometry 435 14.3 Optical Developments to Obtain Displacement, Contours and Strain Information 439 14.4 Determination of All the Components of the Displacement Vector 3-D Interferometric Moir
e 446 14.5 Application of Moir
e Interferometry to High Temperature Fracture Analysis 451 References 456 15 Shadow Moir
e & Projection Moir
e - The Basic Relationships 459 15.1 Introduction 459 15.2 Basic Equation of Shadow Moir
e 460 15.3 Basic Differential Geometry Properties of Surfaces 461 15.4 Connection between Differential Geometry and Moir
e 463 15.5 Projective Geometry and Projection Moir
e 467 15.6 Epipolar Model of the Two Projectors and One Camera System 469 15.7 Approaches to Extend the Moir
e Method to More General Conditions of Projection and Observation 471 15.8 Summary of the Chapter 482 References 482 16 Moir
e Contouring Applications 485 16.1 Introduction 485 16.2 Basic Principles of Optical Contouring Measuring Devices 486 16.3 Contouring Methods that Utilize Projected Carriers 486 16.4 Parallax Determination in an Area 489 16.5 Mathematical Modeling of the Parallax Determination in an Area 490 16.6 Limitations of the Contouring Model 492 16.7 Applications of the Contouring Methods 494 16.8 Double Projector System with Slope and Depth-of-Focus Corrections 506 16.9 Sensitivity Limits for Contouring Methods 518 References 520 17 Reflection Moir
e 523 17.1 Introduction 523 17.2 Incoherent Illumination. Derivation of the Fundamental Relationship 523 17.3 Interferometric Reflection Moir
e 526 17.4 Analysis of the Sensitivity that can be Achieved with the Described Setups 530 17.5 Determination of the Deflection of Surfaces Using Reflection Moir
e 531 17.6 Applications of the Reflection Moir
e Method 532 17.7 Reflection Moir
e Application - Analysis of a Shell 539 References 545 18 Speckle Patterns and Their Properties 547 18.1 Introduction 547 18.2 First Order Statistics 550 18.3 Three Dimensional Structure of Speckle Patterns 558 18.4 Sensor Effect on Speckle Statistics 560 18.5 Utilization of Speckles to Measure Displacements. Speckle Interferometry 562 18.6 Decorrelation Phenomena 564 18.7 Model for the Formation of the Interference Fringes 567 18.8 Integrated Regime. Metaspeckle 569 18.9 Sensitivity Vector 572 18.10 Speckle Techniques Set-Ups 573 18.11 Out-of-Plane Interferometer 576 18.12 Shear Interferometry (Shearography) 577 18.13 Contouring Interferometer 578 18.14 Double Viewing. Duffy Double Aperture Method 579 References 581 19 Speckle 2 583 19.1 Speckle Photography 583 19.2 Point-Wise Observation of the Speckle Field 584 19.3 Global View 585 19.4 Different Set-Ups for Speckle Photography 589 19.5 Applications of Speckle Interferometry 590 19.6 High Temperature Strain Measurement 593 19.7 Four Beam Interferometer Sensitive to in Plane Displacements 597 References 606 20 Digital Image Correlation (DIC) 607 20.1 Introduction 607 20.2 Process to Obtain the Displacement Information 608 20.3 Basic Formulation of the Problem 610 20.4 Introduction of Smoothing Functions to Solve the Optimization Problem 613 20.5 Determination of the Components of the Displacement Vector 618 20.6 Important Factors that Influence the Packages of DIC 619 20.7 Evaluation of the DIC Method 621 20.8 Double Viewing DIC. Stereo Vision 627 References 628 21 Holographic Interferometry 631 21.1 Holography 631 21.2 Basic Elements of the Holographic Process 632 21.3 Properties of Holograms 634 21.4 Set up to Record Holograms 636 21.5 Holographic Interferometry 641 21.6 Derivation of the Equation of the Sensitivity Vector 644 21.7 Measuring Displacements 646 21.8 Holographic Moir
e 651 21.9 Lens Holography 658 21.10 Holographic Moir
e. Real Time Observation 661 21.11 Displacement Analysis of Curved Surfaces 665 21.12 Holographic Contouring 669 21.13 Measurement of Displacements in 3D of Transparent Bodies 675 21.14 Fiber Optics Version of the Holographic Moir
e System 675 References 677 22 Digital and Dynamic Holography 681 22.1 Digital Holography 681 22.2 Determination of Strains from 3D Holographic Moir
e Interferograms 685 22.3 Introduction to Dynamic Holographic Interferometry 689 22.4 Vibration Analysis 693 22.5 Experimental Set up for Time Average Holography 695 22.6 Investigation on Fracture Behavior of Turbine Blades Under Self-Exciting Modes 700 22.7 Dynamic Holographic Interferometry. Impact Analysis. Wave Propagation 708 22.8 Applications of Dynamic Holographic Interferometry 712 References 721 Index 723
e Patterns. One Dimensional Case 388 13.3 Formation of Moir
e Patterns. Two Dimensional Case 390 13.4 Relationship of the Displacement Vector and the Strain Tensor Components 393 13.5 Properties of the Moire Fringes (Isothetic Lines) 395 13.6 Sections of the Surface of Projected Displacements 396 13.7 Singular Points and Singular Lines 401 13.8 Digital Moir
e 402 13.9 Equipment Required to Apply the Moir
e Method for Displacement and Strain Determination Utilizing Incoherent Illumination 412 13.10 Strain Analysis at the Sub-Micrometer Scale 419 13.11 Three Dimensional Moir
e 424 13.12 Dynamic Moir
e 426 References 432 14 Moir
e Method. Coherent Ilumination 435 14.1 Introduction 435 14.2 Moir
e Interferometry 435 14.3 Optical Developments to Obtain Displacement, Contours and Strain Information 439 14.4 Determination of All the Components of the Displacement Vector 3-D Interferometric Moir
e 446 14.5 Application of Moir
e Interferometry to High Temperature Fracture Analysis 451 References 456 15 Shadow Moir
e & Projection Moir
e - The Basic Relationships 459 15.1 Introduction 459 15.2 Basic Equation of Shadow Moir
e 460 15.3 Basic Differential Geometry Properties of Surfaces 461 15.4 Connection between Differential Geometry and Moir
e 463 15.5 Projective Geometry and Projection Moir
e 467 15.6 Epipolar Model of the Two Projectors and One Camera System 469 15.7 Approaches to Extend the Moir
e Method to More General Conditions of Projection and Observation 471 15.8 Summary of the Chapter 482 References 482 16 Moir
e Contouring Applications 485 16.1 Introduction 485 16.2 Basic Principles of Optical Contouring Measuring Devices 486 16.3 Contouring Methods that Utilize Projected Carriers 486 16.4 Parallax Determination in an Area 489 16.5 Mathematical Modeling of the Parallax Determination in an Area 490 16.6 Limitations of the Contouring Model 492 16.7 Applications of the Contouring Methods 494 16.8 Double Projector System with Slope and Depth-of-Focus Corrections 506 16.9 Sensitivity Limits for Contouring Methods 518 References 520 17 Reflection Moir
e 523 17.1 Introduction 523 17.2 Incoherent Illumination. Derivation of the Fundamental Relationship 523 17.3 Interferometric Reflection Moir
e 526 17.4 Analysis of the Sensitivity that can be Achieved with the Described Setups 530 17.5 Determination of the Deflection of Surfaces Using Reflection Moir
e 531 17.6 Applications of the Reflection Moir
e Method 532 17.7 Reflection Moir
e Application - Analysis of a Shell 539 References 545 18 Speckle Patterns and Their Properties 547 18.1 Introduction 547 18.2 First Order Statistics 550 18.3 Three Dimensional Structure of Speckle Patterns 558 18.4 Sensor Effect on Speckle Statistics 560 18.5 Utilization of Speckles to Measure Displacements. Speckle Interferometry 562 18.6 Decorrelation Phenomena 564 18.7 Model for the Formation of the Interference Fringes 567 18.8 Integrated Regime. Metaspeckle 569 18.9 Sensitivity Vector 572 18.10 Speckle Techniques Set-Ups 573 18.11 Out-of-Plane Interferometer 576 18.12 Shear Interferometry (Shearography) 577 18.13 Contouring Interferometer 578 18.14 Double Viewing. Duffy Double Aperture Method 579 References 581 19 Speckle 2 583 19.1 Speckle Photography 583 19.2 Point-Wise Observation of the Speckle Field 584 19.3 Global View 585 19.4 Different Set-Ups for Speckle Photography 589 19.5 Applications of Speckle Interferometry 590 19.6 High Temperature Strain Measurement 593 19.7 Four Beam Interferometer Sensitive to in Plane Displacements 597 References 606 20 Digital Image Correlation (DIC) 607 20.1 Introduction 607 20.2 Process to Obtain the Displacement Information 608 20.3 Basic Formulation of the Problem 610 20.4 Introduction of Smoothing Functions to Solve the Optimization Problem 613 20.5 Determination of the Components of the Displacement Vector 618 20.6 Important Factors that Influence the Packages of DIC 619 20.7 Evaluation of the DIC Method 621 20.8 Double Viewing DIC. Stereo Vision 627 References 628 21 Holographic Interferometry 631 21.1 Holography 631 21.2 Basic Elements of the Holographic Process 632 21.3 Properties of Holograms 634 21.4 Set up to Record Holograms 636 21.5 Holographic Interferometry 641 21.6 Derivation of the Equation of the Sensitivity Vector 644 21.7 Measuring Displacements 646 21.8 Holographic Moir
e 651 21.9 Lens Holography 658 21.10 Holographic Moir
e. Real Time Observation 661 21.11 Displacement Analysis of Curved Surfaces 665 21.12 Holographic Contouring 669 21.13 Measurement of Displacements in 3D of Transparent Bodies 675 21.14 Fiber Optics Version of the Holographic Moir
e System 675 References 677 22 Digital and Dynamic Holography 681 22.1 Digital Holography 681 22.2 Determination of Strains from 3D Holographic Moir
e Interferograms 685 22.3 Introduction to Dynamic Holographic Interferometry 689 22.4 Vibration Analysis 693 22.5 Experimental Set up for Time Average Holography 695 22.6 Investigation on Fracture Behavior of Turbine Blades Under Self-Exciting Modes 700 22.7 Dynamic Holographic Interferometry. Impact Analysis. Wave Propagation 708 22.8 Applications of Dynamic Holographic Interferometry 712 References 721 Index 723