113,95 €
113,95 €
inkl. MwSt.
Sofort per Download lieferbar
payback
57 °P sammeln
113,95 €
113,95 €
inkl. MwSt.
Sofort per Download lieferbar

Alle Infos zum eBook verschenken
payback
57 °P sammeln
Als Download kaufen
113,95 €
inkl. MwSt.
Sofort per Download lieferbar
payback
57 °P sammeln
Jetzt verschenken
113,95 €
inkl. MwSt.
Sofort per Download lieferbar

Alle Infos zum eBook verschenken
payback
57 °P sammeln
  • Format: PDF

A major barrier to the introduction of ferroelectric devices into mass markets remains their limited reliability due to fatigue. The underlying physical and chemical mechanisms of this material fatigue phenomenon are extremely complex, and the relevant influences range from single-point defects to macroscopic boundary conditions. This book summarizes the different aspects of fatigue in ferroelectrics. It is primarily concerned with bulk material effects. Mechanical, electrical, and physico-chemical processes are described; reference data are given for different loading regimes and boundary…mehr

  • Geräte: PC
  • ohne Kopierschutz
  • eBook Hilfe
  • Größe: 24.73MB
Produktbeschreibung
A major barrier to the introduction of ferroelectric devices into mass markets remains their limited reliability due to fatigue. The underlying physical and chemical mechanisms of this material fatigue phenomenon are extremely complex, and the relevant influences range from single-point defects to macroscopic boundary conditions. This book summarizes the different aspects of fatigue in ferroelectrics. It is primarily concerned with bulk material effects. Mechanical, electrical, and physico-chemical processes are described; reference data are given for different loading regimes and boundary conditions; and various fatigue models are compared. The monograph also demonstrates how the results of acoustic emission and of microscopy studies reveal the microscopic origins of fatigue in ferroelectric devices.


Dieser Download kann aus rechtlichen Gründen nur mit Rechnungsadresse in A, B, BG, CY, CZ, D, DK, EW, E, FIN, F, GR, HR, H, IRL, I, LT, L, LR, M, NL, PL, P, R, S, SLO, SK ausgeliefert werden.

Autorenporträt
Doru C. Lupascu, Technische Universität Darmstadt, Germany