Foundations of Statistical Inference (eBook, PDF)

Proceedings of the Shoresh Conference 2000
Redaktion: Haitovsky, Yoel; Ritov, Ya'acov; Lerche, Hans Rudolf

• Format: PDF

Produktbeschreibung

This volume is a compressed survey containing recent results on statistics of stochastic processes and on identification with incomplete observations. It comprises a collection of papers presented at the Shoresh Conference 2000 on the Foundation of Statistical Inference. The papers cover the following areas with high research activity:

- Identification with Incomplete Observations, Data Mining, - Bayesian Methods and Modelling, - Testing, Goodness of Fit and Randomness, - Statistics of Stationary Processes.

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Produktdetails

• Verlag: Physica-Verlag HD
• Seitenzahl: 230
• Erscheinungstermin: 6. Dezember 2012
• Englisch
• ISBN-13: 9783642574108
• Artikelnr.: 53524626

Autorenporträt

Yoel Haitovsky, Hebrew University, Jerusalem, Israel / Hans Rudolf Lerche, University of Freiburg, Germany / Yaacov Ritov, Hebrew University, Jerusalem, Israel

Inhaltsangabe

I. Identification with Incomplete Observations, Data Mining.- Bounding Entries in Multi-way Contingency Tables Given aSet of Marginal Totals.- Identification and Estimation with Incomplete Data.- Computational Information Retrieval.- Studying Treatment Response to Inform Treatment Choice.- II. Bayesian Methods and Modelling.- Some Interactive Decision Problems Emerging in Statistical Games.- Probabilistic Modelling: An Historical andPhilosophical Digression.- A Bayesian View on Sampling the 2 x 2 Table.- Bayesian Designs for Binomial Experiments.- On the Second Order Minimax Improvement of the Sample Mean in the Estimation of a Mean Value of the Exponential Dispersion Family.- Bayesian Analysis of Cell Migration ¡ªLinking Experimental Data and Theoretical Models.- III. Testing, Goodness of Fit and Randomness.- Sequential Bayes Detection of Trend Changes.- Box¡ªCox Transformation for Semiparametric Comparison of Two Samples.- Minimax Nonparametric Goodness-of-Fit Testing.- Testing Randomness on the Basis of theNumber of Different Patterns.- The 7r* Index as a New Alternative for Assessing Goodness of Fit of Logistic Regression.- IV. Statistics of Stationary Processes.- Consistent Estimation of Early and Frequent Change Points.- Asymptotic Behaviour of Estimators of the Parameters of Nearly Unstable INAR(1) Models.- Guessing the Output of a Stationary Binary Time Series.- Asymptotic Expansions for Long-MemoryStationary Gaussian Processes.- Contributors.