Full Field Optical Metrology methods and techniques have been in existence since the very first interferometry experiments by Thomas Young in the 19th Century. These methods involve illuminating an object with quasi-monochromatic light to interrogate non-invasively (non-contact or non-destructively) how the object behaves/changes when it is subjected to any disturbances that may change its initial/original physical condition. Performing exploratory studies with full-field optical methods/techniques can infer physical and mechanical parameters. The non-contact and non-destructive nature of these inspections has revolutionized how we measure our world.
Optical metrology involves several techniques and methods already dealt with at different levels of detail in many books. This book introduces non-contact optical techniques based on the speckle effect in more detail. The text is not only about surface metrology. It explores other characteristics related to the surface, such as strain, stress, vibration, contouring, and its x, y, and z displacements (coupled as vectors in 2D and 3D). In addition, the book presents modern methods for phase retrieval, optical coherence tomography (OCT), and the moiré method.
Scientists and Engineers looking for a reference book giving detailed work on methods/techniques in full-field speckle-based metrology are the key audiences for this text.
Optical metrology involves several techniques and methods already dealt with at different levels of detail in many books. This book introduces non-contact optical techniques based on the speckle effect in more detail. The text is not only about surface metrology. It explores other characteristics related to the surface, such as strain, stress, vibration, contouring, and its x, y, and z displacements (coupled as vectors in 2D and 3D). In addition, the book presents modern methods for phase retrieval, optical coherence tomography (OCT), and the moiré method.
Scientists and Engineers looking for a reference book giving detailed work on methods/techniques in full-field speckle-based metrology are the key audiences for this text.
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