Chin-Diew Lai

Generalized Weibull Distributions (eBook, PDF)

• Format: PDF

Produktbeschreibung

The Weibull distribution has been one of the most cited lifetime distributions in reliability engineering. Over the last decade, many generalizations and extensions of the Weibull have been proposed in order to provide more flexibility than the traditional version when it comes to modeling lifetime data in diverse fields. This book offers an update on these developments, presenting the essential properties of each model. Several plots of density and hazard rate functions are also included, and a brief outline of known application(s) for each model is also given. ¿

---

Dieser Download kann aus rechtlichen Gründen nur mit Rechnungsadresse in A, B, BG, CY, CZ, D, DK, EW, E, FIN, F, GR, HR, H, IRL, I, LT, L, LR, M, NL, PL, P, R, S, SLO, SK ausgeliefert werden.

Produktdetails

• Verlag: Springer Berlin Heidelberg
• Seitenzahl: 118
• Erscheinungstermin: 17. Oktober 2013
• Englisch
• ISBN-13: 9783642391064
• Artikelnr.: 43798391

Autorenporträt

Chin-Diew Lai is a Professor of Statistics at Massey University, New Zealand. Dr Lai has published over 100 research articles and four monographs, including two published by Springer: "Stochastic Ageing and Dependence for Reliability" co-authored by M Xie, and "Continuous Bivariate Distributions," 2nd edition, co-authored by N Balakrishnan.

Inhaltsangabe

1. Weibull Distribution.- 2.Generalized Weibull Distributions.- 3.Models Involving Two or More Weibull Distributions.- 4.Discrete Weibull Distributions and Their Generalizations.- References.- Index.

Rezensionen

"This brief monograph attempts to summarize the up-to-date status of the research and development of generalized Weibull distribution. ... This book is a great resource for researchers in theory of statistical distributions, applied statisticians and reliability engineers who want a bird's eye perspective of the most up-to-date synopsis on generalizations and modifications of the Weibull distribution." (Hon Keung Tony Ng, Technometrics, Vol. 57 (1), February, 2015)