192,95 €
192,95 €
inkl. MwSt.
Sofort per Download lieferbar
payback
96 °P sammeln
192,95 €
192,95 €
inkl. MwSt.
Sofort per Download lieferbar

Alle Infos zum eBook verschenken
payback
96 °P sammeln
Als Download kaufen
192,95 €
inkl. MwSt.
Sofort per Download lieferbar
payback
96 °P sammeln
Jetzt verschenken
192,95 €
inkl. MwSt.
Sofort per Download lieferbar

Alle Infos zum eBook verschenken
payback
96 °P sammeln
  • Format: ePub

Balancing its coverage of theory with a wide range of application areas, Handbook of Charged Particle Optics provides a complete guide to understanding, designing, and using high-resolution instrumentation such as scanning electron microscope (SEM), scanning transmission electron microscope (STEM), and focused ion beam (FIB) systems. This second edition features new chapters on aberration correction, the transmission electron microscope (TEM), and applications of gas phase field ionization sources. Including additional references to past and present work in the field, this comprehensive text…mehr

  • Geräte: eReader
  • mit Kopierschutz
  • eBook Hilfe
  • Größe: 29.87MB
Produktbeschreibung
Balancing its coverage of theory with a wide range of application areas, Handbook of Charged Particle Optics provides a complete guide to understanding, designing, and using high-resolution instrumentation such as scanning electron microscope (SEM), scanning transmission electron microscope (STEM), and focused ion beam (FIB) systems. This second edition features new chapters on aberration correction, the transmission electron microscope (TEM), and applications of gas phase field ionization sources. Including additional references to past and present work in the field, this comprehensive text also presents up-to-date information of Schottky electron as well as liquid metal ion sources.


Dieser Download kann aus rechtlichen Gründen nur mit Rechnungsadresse in A, B, BG, CY, CZ, D, DK, EW, E, FIN, F, GR, HR, H, IRL, I, LT, L, LR, M, NL, PL, P, R, S, SLO, SK ausgeliefert werden.