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This highly anticipated new edition provides a comprehensive account of face recognition research and technology, spanning the full range of topics needed for designing operational face recognition systems. After a thorough introductory chapter, each of the following chapters focus on a specific topic, reviewing background information, up-to-date techniques, and recent results, as well as offering challenges and future directions. Features: fully updated, revised and expanded, covering the entire spectrum of concepts, methods, and algorithms for automated face detection and recognition…mehr

Produktbeschreibung
This highly anticipated new edition provides a comprehensive account of face recognition research and technology, spanning the full range of topics needed for designing operational face recognition systems. After a thorough introductory chapter, each of the following chapters focus on a specific topic, reviewing background information, up-to-date techniques, and recent results, as well as offering challenges and future directions. Features: fully updated, revised and expanded, covering the entire spectrum of concepts, methods, and algorithms for automated face detection and recognition systems; provides comprehensive coverage of face detection, tracking, alignment, feature extraction, and recognition technologies, and issues in evaluation, systems, security, and applications; contains numerous step-by-step algorithms; describes a broad range of applications; presents contributions from an international selection of experts; integrates numerous supporting graphs, tables, charts, and performance data.
Autorenporträt
Dr. Stan Z. Li is Professor at the National Laboratory of Pattern Recognition, Director of the Center for Biometrics and Security Research, and Director of the R&D Center for Visual Internet of Things, within the Chinese Academy of Sciences. Dr. Anil K. Jain is University Distinguished Professor in the Department of Computer Science and Engineering at Michigan State University, U.S.A.