David J. Whitehouse

Handbook of Surface and Nanometrology (eBook, PDF)

• Format: PDF

Produktbeschreibung

Updated and expanded, this definitive reference determines how the reduction in scale from macro to nano has affected all aspects of surface use and measurement and discusses the impact of this shift on characterization, standardization, manufacture, and performance. Written with a pervasive nanotechnological perspective, this edition covers new methods of production and measurement as well as new performance requirements in nanometronomy practice. Like its predecessor, it continues to provide in-depth, extensive coverage of the engineering, physics, materials, mathematics, and computing involved in surface metrology and nanometrology.

---

Dieser Download kann aus rechtlichen Gründen nur mit Rechnungsadresse in A, B, BG, CY, CZ, D, DK, EW, E, FIN, F, GR, HR, H, IRL, I, LT, L, LR, M, NL, PL, P, R, S, SLO, SK ausgeliefert werden.

Produktdetails

• Verlag: Taylor & Francis
• Seitenzahl: 999
• Erscheinungstermin: 20. Dezember 2010
• Englisch
• ISBN-13: 9781420082029
• Artikelnr.: 57151075

Autorenporträt

Regarded as one of the world's top authorities on surface and nanometrology, David J. Whitehouse is professor emeritus of engineering science at the University of Warwick, where he was chief scientist in the School of Engineering. He has also been a consultant to numerous organizations, such as Rolls Royce, Taylor Hobson, Kodak, Unilever, General Motors, Caterpillar, 3M, Toshiba Japan, UBM Germany, and the Atomic Weapons Research Establishment. He has published 5 books and more than 250 technical papers, holds 23 patents, and was founding editor of the first peer-reviewed international journal on nanoscale science and technology, Nanotechnology. Professor Whitehouse has been a recipient of many awards, including the Lifetime Achievement Award from the American Society for Precision Engineering, the Champion of Metrology award from the National Physical Laboratory, and the Commemorative Medallion of the Mendeleev Institute of Metrology.