Rajpal S. Sirohi

Introduction to Optical Metrology (eBook, PDF)

• Format: PDF

Produktbeschreibung

This book examines the theory and practice of various measurement methodologies utilizing the wave nature of light. It discusses interferometry, speckle metrology, moiré phenomenon, photoelasticity, and microscopy. It describes the principles used to measure refractive indices of solids, liquids, and gases. It presents methods for measuring curvature, focal length, angle, thickness, velocity, pressure, and length. It details techniques for optical testing as well as for making fiber optic- and MEMS-based measurements. It also features exercise problems at the end of each chapter for applied learning.

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Produktdetails

• Verlag: Taylor & Francis
• Seitenzahl: 449
• Erscheinungstermin: 12. Juli 2017
• Englisch
• ISBN-13: 9781482236118
• Artikelnr.: 54274224

Autorenporträt

Rajpal S. Sirohi, Ph.D, is currently chair professor of the Physics Department at Tezpur University, India, and senior editor of Optical Engineering. Previously, he was director of the Indian Institute of Technology Delhi; vice-chancellor of Barkatullah University, Bhopal; vice-chancellor of Shobhit University, Meerut; and vice-chancellor of Amity University, Jaipur. He also served in various capacities at the Indian Institute of Science, Bangalore; Indian Institute of Technology Madras, Chennai; Case Western Reserve University, Cleveland, Ohio, USA; Rose-Hulman Institute of Technology, Terre Haute, Indiana, USA; Institute for Advanced Studies, University of Malaya, Malaysia; University of Namibia; National University of Singapore; and École Polytechnique Fédérale de Lausanne, Switzerland. Widely published and highly decorated, Professor Sirohi is or has been a fellow, honorary fellow, invited fellow, member, board member, and former president of numerous scientific academies, associations, committees, societies, and journals.