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This book presents the theory of quantum effects used in metrology and results of the author’s own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular.…mehr
This book presents the theory of quantum effects used in metrology and results of the author’s own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called Quantum SI, is introduced. This book helps to understand and approve the new system to both technology and academic community.
Waldemar Nawrocki is a professor of electronics at Poznan University of Technology, Poland, where he earned a Ph.D. in technical sciences in 1981. Dr. Nawrocki also holds a D.Sc. in physics from Jena University, Germany (since 1990). His research fields are: Quantum Metrology, Measurement System, Nanoelectronics and Cryoelectronics. W. Nawrocki has published 15 books. From 2006 to 2016 he has organized and chaired five international conferences on quantum metrology in Poznan.
Inhaltsangabe
Theoretical Background of Quantum Metrology.- Measures, Standards and Systems of Units.- Quantum Voltage Standards.- SQUID Detectors of Magnetic Flux.- Quantum Hall Effect.- Quantization of Electrical Conductance and Thermal Conductance in Nanostructures.- Single Electron Tunneling and Possible Current Standard.- Atomic Clocks and Time Scales.- Interferometers and Measurements of Length.- Scanning Probe Microscopes.- Other Quantum Detectors.- Standards of the Kilogram Based on Fundamental Physical Constants.
Preface.- Theoretical Background of Quantum Metrology.- Measurements, Standards and Systems of Units.- The Revised SI System of Units.- Quantum Voltage Standards.- SQUID Detectors of Magnetic Flux.- Quantum Hall Effect and the Resistance Standard.- Quantization of Electrical Conductance and Thermal Conductance in Nanostructures.- Single Electron Tunneling.- Atomic Clocks and Time Scales.- Standards and Measurements of Length.- Satellite Navigation Systems.- Scanning Probe Microscopes.- New Standards of Mass.
Theoretical Background of Quantum Metrology.- Measures, Standards and Systems of Units.- Quantum Voltage Standards.- SQUID Detectors of Magnetic Flux.- Quantum Hall Effect.- Quantization of Electrical Conductance and Thermal Conductance in Nanostructures.- Single Electron Tunneling and Possible Current Standard.- Atomic Clocks and Time Scales.- Interferometers and Measurements of Length.- Scanning Probe Microscopes.- Other Quantum Detectors.- Standards of the Kilogram Based on Fundamental Physical Constants.
Preface.- Theoretical Background of Quantum Metrology.- Measurements, Standards and Systems of Units.- The Revised SI System of Units.- Quantum Voltage Standards.- SQUID Detectors of Magnetic Flux.- Quantum Hall Effect and the Resistance Standard.- Quantization of Electrical Conductance and Thermal Conductance in Nanostructures.- Single Electron Tunneling.- Atomic Clocks and Time Scales.- Standards and Measurements of Length.- Satellite Navigation Systems.- Scanning Probe Microscopes.- New Standards of Mass.
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