Ronald D. Slusky

Invention Analysis and Claiming (eBook, ePUB)

A Patent Lawyer's Guide, Second Edition

• Format: ePub

Produktbeschreibung

Invention Analysis and Claiming: A Patent Lawyer's Guide, Second Edition, presents a comprehensive approach to analyzing inventions and capturing them in a sophisticated set of patent claims. A central theme is the importance of using the problem-solution paradigm to identify the "inventive concept" before the claim-drafting begins.

The book's teachings are grounded in "old school" principles of patent practice that, before now, have been learned only on the job from supervisors and mentors. In addition, a new chapter is devoted to means-plus-function claiming--explaining its history, how the Federal Circuit case law has dramatically affected the practice in this realm, and how the patent practitioner can secure appropriately broad coverage for the inventive concept while not triggering "means-plus-function treatment."

Questions at the end of each chapter have been added to:

• Confirm the understanding of the principles presented;
• Explore the jurisprudential and practical implications of those principles; and
• Try out the invention analysis and claim drafting skills taught in the chapter

For additional information regarding the topic please visit Ronald Slusky's Invention Analysis and Claiming Seminar for events near you.

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Produktdetails

• Verlag: American Bar Association
• Seitenzahl: 375
• Erscheinungstermin: 7. Oktober 2013
• Englisch
• ISBN-13: 9781614385622
• Artikelnr.: 62322004

Autorenporträt

Ronald D. Slusky has been a patent professional for thirty five years and is currently in private practice in New York City. For thirteen of his thirty years at Bell Labs, he was in patent management, supervising and mentoring small and large groups of patent attorneys. Mr. Slusky is the author of several instructional booklets and is the co-author of a chapter in Advances in Image Pickup Density (Academic Press, 1981). He has a B.S. and an M.S. in electrical engineering from Columbia University, a J.D. from Seton Hall University and is admitted to practice in New Jersey and the U.S. Patent and Trademark Office.