Michael Nastasi, James W. Mayer, Yongqiang Wang

Ion Beam Analysis (eBook, PDF)

Fundamentals and Applications

• Format: PDF

Produktbeschreibung

This book explains the basic characteristics of ion beams as applied to the analysis of materials, as well as IBA of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization. It starts with coverage of the fundamentals of ion beam analysis, including kinematics, ion stopping, Rutherford backscattering, channeling, elastic recoil detection, particle induced x-ray emission, and nuclear reaction analysis. The second part turns to applications, looking at the broad range of potential uses in thin film reactions, ion implantation, nuclear energy, biology, and art/archaeology.

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Produktdetails

• Verlag: Taylor & Francis
• Seitenzahl: 472
• Erscheinungstermin: 27. August 2014
• Englisch
• ISBN-13: 9781439846391
• Artikelnr.: 42505797

Autorenporträt

Michael Nastasi is director of the Nebraska Center for Energy Sciences Research (NCESR) and Elmer Koch Professor in the Department of Mechanical and Materials Engineering at the University of Nebraska-Lincoln. Prior to this appointment he was director of the Department of Energy (DOE) Energy Frontier Research Center on Materials at Irradiation and Mechanical Extremes and nanoelectronics and mechanics thrust leader at the Center for Integrated Nanotechnologies (CINT). He served as team leader for the Nanoscience and Ion-Solid Interaction Team and as fellow at Los Alamos National Laboratory. He earned his PhD in materials science and engineering at Cornell University. Dr. Nastasi is an elected fellow of the American Physical Society (APS) and the Materials Research Society (MRS).
James W. Mayer (1930-2013), was a pioneer in the application of ion beam techniques for materials analysis. He received his PhD from Purdue University, followed by appointments at California Institute of Technology (1967-1980) and Cornell University (1980-1992), as Francis Norwood Bard Professor of Materials Science and Engineering and director of the Microscience and Technology Program. He was appointed to the faculty at Arizona State University (ASU) in 1992, where he became Regents' Professor and P.V. Galvin Professor of Science and Engineering, as well as director of the Center for Solid State Science until his retirement. His research contributions were in many areas of solid-state engineering, especially ion implantation and Rutherford backscattering spectrometry. Among his many accolades, Dr. Mayer was recipient of the Materials Research Society's Von Hippel Award, a fellow of the American Physical Society and Institute of Electrical and Electronic Engineers, and an elected member of the National Academy of Engineering.

Yongqiang Wang is the team leader of the Ion Beam Materials Laboratory (IBML) in Los Alamos National Laboratory. Dr. Wan

Inhaltsangabe

Section I-Fundamentals. Overview. Kinematics. Cross Section. Ion Stopping.
Backscattering Spectrometry. Elastic Recoil Detection Analysis. Nuclear
Reaction Analysis. Particle-Induced X-Ray Emission Analysis. Ion
Channeling. Section II-Applications. Thin Film Depth Profiling. Defects
Measurements of a Crystalline Solid. Nuclear Energy Research Applications.
Art and Archaeology Applications. Biomedical Applications. IBA Software.
Appendices.

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Section I-Fundamentals. Overview. Kinematics. Cross Section. Ion Stopping. Backscattering Spectrometry. Elastic Recoil Detection Analysis. Nuclear Reaction Analysis. Particle-Induced X-Ray Emission Analysis. Ion Channeling. Section II-Applications. Thin Film Depth Profiling. Defects Measurements of a Crystalline Solid. Nuclear Energy Research Applications. Art and Archaeology Applications. Biomedical Applications. IBA Software. Appendices.