The book presents result in the field of testing and diagnosis of analog and mixed-signal circuits. The most important feature of the book is that it promotes artificial intelligence as a key tool in the subject of test signal generation and, especially, in analog and mixed-signal diagnosis. The book covers definitions of faults and fault effects; analog signal test synthesis, concurrent fault simulation of linear and nonlinear analog dynamic circuits; combinational circuit test synthesis; mixed-signal testing; design for testability of digital and mixed-signal circuits; built-in test for analog circuits; diagnosis of analog and mixed-signal circuits; and an overview of testing and diagnosis as industrial and business activity. A chapter containing a set of worked examples is added. To complete, a short repositorium of analog artificial neural networks is given at the end of the book.
Dieser Download kann aus rechtlichen Gründen nur mit Rechnungsadresse in A, B, BG, CY, CZ, D, DK, EW, E, FIN, F, GR, HR, H, IRL, I, LT, L, LR, M, NL, PL, P, R, S, SLO, SK ausgeliefert werden.