Juan Jimenez

Microprobe Characterization of Optoelectronic Materials (eBook, PDF)

• Format: PDF

Produktbeschreibung

Each chapter in this book is written by a group of leading experts in one particular type of microprobe technique. They emphasize the ability of that technique to provide information about small structures (i.e. quantum dots, quantum lines), microscopic defects, strain, layer composition, and its usefulness as diagnostic technique for device degrad

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Produktdetails

• Verlag: Taylor & Francis
• Seitenzahl: 730
• Erscheinungstermin: 1. November 2024
• Englisch
• ISBN-13: 9781040283820
• Artikelnr.: 72290648

Autorenporträt

Juan Jiménez is a Professor at the University of Valladolid, Spain, working in the field of microscopic characterization of semiconductors, using electron (Cathodoluminescence) and optical (photoluminescence, Raman scattering and photocurrent) beams. He has studied the local properties and uniformity of GaAs, SiC, InP and other semiconductors. He received his degree in Physics from the University of Valladolid in 1975 and his PhD from Valladolid in 1979. He undertook postdoctoral work at the University of Montpellier, France from 1978-1981 and received a PhD from Montpellier University in 1981.