A. G. Cullis

Microscopy of Semiconducting Materials 1983, Third Oxford Conference on Microscopy of Semiconducting Materials, St Catherines College, March 1983 (eBook, PDF)

• Format: PDF

Produktbeschreibung

This volume contains invited and contributed papers at the conference on Microscopy of Semiconducting Materials which took place on 21-23 March 1983 in St Cathernine's College, Oxford. The conference was the third in the series devoted to advances in microscopical studies of semiconductors.

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Produktdetails

• Verlag: Taylor & Francis
• Seitenzahl: 300
• Erscheinungstermin: 25. November 2020
• Englisch
• ISBN-13: 9781000112160
• Artikelnr.: 60572681

Autorenporträt

A. G. Cullis (Author) , S. M. Davidson (Edited by) , G. R. Booker (Edited by)

Inhaltsangabe

Section 1 Structure and properties of dislocations
Section 2 High resolution microscopy
Section 3 Transient annealing phenomena
Section 4 Silicon characterisation
Section 5 Compund semiconductor characterization
Section 6 Scanning EBIC and CL
Section 7 X-ray techniques
Section 8 Non-conventional microscopy
Section 9 Device assement by scanning microscopy
Section 10 Device assessment by transmisison microscopy.