A. G. Cullis

Microscopy of Semiconducting Materials 1983, Third Oxford Conference on Microscopy of Semiconducting Materials, St Catherines College, March 1983 (eBook, PDF)

• Format: PDF

Produktbeschreibung

This volume contains invited and contributed papers at the conference on Microscopy of Semiconducting Materials which took place on 2123 March 1983 in St Cathernine's College, Oxford. The conference was the third in the series devoted to advances in microscopical studies of semiconductors.

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Produktdetails

• Verlag: Taylor & Francis
• Seitenzahl: 300
• Erscheinungstermin: 25. November 2020
• Englisch
• ISBN-13: 9781000112160
• Artikelnr.: 60572681

Autorenporträt

A. G. Cullis (Author) , S. M. Davidson (Edited by) , G. R. Booker (Edited by)

Inhaltsangabe

Section 1 Structure and properties of dislocations
Section 2 High resolution microscopy
Section 3 Transient annealing phenomena
Section 4 Silicon characterisation
Section 5 Compund semiconductor characterization
Section 6 Scanning EBIC and CL
Section 7 X-ray techniques
Section 8 Non-conventional microscopy
Section 9 Device assement by scanning microscopy
Section 10 Device assessment by transmisison microscopy.